Electrothermal Effects on Reliability of Vertical Resistive Random Access Memory Array by Parallel Computing

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Guodong Zhu ◽  
Xingxing Xu ◽  
Shuo Zhang ◽  
Wen-Yan Yin ◽  
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Peng Huang ◽  
Bin Gao ◽  
Bing Chen ◽  
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pp. 1538-1541 ◽  
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Nanoscale ◽  
2017 ◽  
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pp. 6649-6657 ◽  
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