Two-Step Deposition Method for Improvement of the Electrical Characteristics of BST Thin Films

Author(s):  
D. Kil ◽  
Byung-Il Lee ◽  
Seung-Ki Joo
RSC Advances ◽  
2014 ◽  
Vol 4 (77) ◽  
pp. 41159-41163 ◽  
Author(s):  
Shinae Kim ◽  
Boseok Kang ◽  
Minjung Lee ◽  
Seung Goo Lee ◽  
Kilwon Cho ◽  
...  

We developed a facile post-deposition method for preparing high-performance organic transistors using direct solvent exposure.


2019 ◽  
Vol 45 (5) ◽  
pp. 5503-5510 ◽  
Author(s):  
Fahimeh Emadi ◽  
Ali Nemati ◽  
Manuel Hinterstein ◽  
Esmaeil Adabifiroozjaei

2004 ◽  
Vol 13 (1-3) ◽  
pp. 83-88
Author(s):  
S. S. Kim ◽  
E. K. Choi ◽  
H. J. Kim ◽  
M. H. Park ◽  
H. S. Lee ◽  
...  

2009 ◽  
Vol 129 (9) ◽  
pp. 620-626
Author(s):  
Kazuatsu Ito ◽  
Yuuki Sato ◽  
Motonari Adachi ◽  
Shinzo Yoshikado

2006 ◽  
Vol 86 (1) ◽  
pp. 159-169 ◽  
Author(s):  
SU-JAE LEE ◽  
HAN-CHEOL RYU ◽  
YOUNG-TAE KIM ◽  
MIN-HWAN KWAK ◽  
SEUNGEON MOON ◽  
...  

1994 ◽  
Vol 361 ◽  
Author(s):  
Chang Jung Kim ◽  
Dae Sung Yoon ◽  
Joon Sung Lee ◽  
Chaun Gi Choi ◽  
Won Jong Lee ◽  
...  

ABSTRACTThe (100), (111) and randomly oriented PZT thin films were fabricated on Pt/Ti/Coming 7059 glass using sol-gel method. The thin films having different orientation were fabricated by different drying conditions for pyrolysis. The preferred orientations of the PZT thin films were observed using XRD, rocking curves, and pole figures. The microstructures were investigated using SEM. The hysteresis loops and capacitance-voltage characteristics of the films were investigated using a standardized ferroelectric test system. The dielectric constant and current-voltage characteristics of the films were investigated using an impedance analyzer and pA meter, respectively. The films oriented in a particular direction showed superior electrical characteristics to the randomly oriented films.


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