Fast test pattern generation for all path delay faults considering various test classes
Keyword(s):
Keyword(s):
1991 ◽
Vol 10
(10)
◽
pp. 1323-1335
◽
1994 ◽
Vol 13
(12)
◽
pp. 1550-1562
◽
Keyword(s):
2005 ◽
Vol 13
(8)
◽
pp. 996-1001
◽
Keyword(s):
Keyword(s):
1999 ◽
Vol 18
(7)
◽
pp. 1050-1057
◽
Keyword(s):