Test pattern generation for path delay faults in synchronous sequential circuits using multiple fast clocks and multiple observation times
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1991 ◽
Vol 10
(10)
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pp. 1323-1335
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1994 ◽
Vol 13
(12)
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pp. 1550-1562
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2005 ◽
Vol 13
(8)
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pp. 996-1001
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1996 ◽
Vol 15
(8)
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pp. 991-1000
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