DYNAMITE: an efficient automatic test pattern generation system for path delay faults

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.88928 ◽

1991 ◽

Vol 10 (10) ◽

pp. 1323-1335 ◽

Author(s):

K. Fuchs ◽

F. Fink ◽

M.H. Schulz

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Delay Faults ◽

Path Delay Faults ◽

Generation System ◽

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Advanced automatic test pattern generation techniques for path delay faults

[1989] The Nineteenth International Symposium on Fault-Tolerant Computing. Digest of Papers ◽

10.1109/ftcs.1989.105541 ◽

2003 ◽

Author(s):

M.H. Schulz ◽

K. Fuchs ◽

F. Fink

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Delay Faults ◽

Path Delay Faults ◽

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Fast test pattern generation for all path delay faults considering various test classes

Proceedings ETC 93 Third European Test Conference ◽

10.1109/etc.1993.246529 ◽

2002 ◽

Author(s):

K. Fuchs ◽

H.C. Wittmann ◽

K.J. Antreich

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Delay Faults ◽

Path Delay Faults

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A distributed automatic test pattern generation system

High-Performance Computing and Networking - Lecture Notes in Computer Science ◽

10.1007/bfb0020356 ◽

2005 ◽

pp. 105-110 ◽

Author(s):

Peter A. Krauss

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Generation System ◽

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Bit parallel test pattern generation for path delay faults

Proceedings the European Design and Test Conference. ED&TC 1995 ◽

10.1109/edtc.1995.470351 ◽

2002 ◽

Author(s):

M. Henftling ◽

H. Wittman

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Delay Faults ◽

Path Delay Faults ◽

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PLABEK: a complete automatic test pattern generation system for break faults in programmable logic arrays

1995 International Symposium on VLSI Technology Systems and Applications Proceedings of Technical Papers VTSA-95 ◽

10.1109/vtsa.1995.524639 ◽

2002 ◽

Author(s):

Gwo-Haur Hwang ◽

Wen-Zen Shen ◽

Shing Tenqchen

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Programmable Logic ◽

Generation System ◽

Programmable Logic Arrays ◽

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SOCRATES: a highly efficient automatic test pattern generation system

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.3140 ◽

1988 ◽

Vol 7 (1) ◽

pp. 126-137 ◽

Author(s):

M.H. Schulz ◽

E. Trischler ◽

T.M. Sarfert

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Generation System ◽

Automatic Test ◽

Highly Efficient

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Results of a topologically partitioned parallel automatic test pattern generation system on a distributed-memory multiprocessor

[1992] Proceedings. Fifth Annual IEEE International ASIC Conference and Exhibit ◽

10.1109/asic.1992.270264 ◽

2003 ◽

Author(s):

R.H. Bell ◽

R.H. Klenke ◽

J.H. Aylor ◽

R.D. Williams

Keyword(s):

Distributed Memory ◽

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Generation System ◽

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Scalable Compact Test Pattern Generation for Path Delay Faults Based on Functions

2009 27th IEEE VLSI Test Symposium ◽

10.1109/vts.2009.22 ◽

2009 ◽

Author(s):

Edward Flanigan ◽

Spyros Tragoudas ◽

Arkan Abdulrahman

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Delay Faults ◽

Path Delay Faults ◽

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LDS-ATPG: an automatic test pattern generation system for combinational VLSI circuits

10.1109/vtsa.1989.68604 ◽

2003 ◽

Author(s):

Sen-Chung Jiang ◽

Chung Len Lee ◽

Wen-Zen Shen ◽

J.-E. Chen ◽

Ching-Ping Wu

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Vlsi Circuits ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Generation System ◽

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RESIST: a recursive test pattern generation algorithm for path delay faults considering various test classes

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.331411 ◽

1994 ◽

Vol 13 (12) ◽

pp. 1550-1562 ◽

Author(s):

K. Fuchs ◽

M. Pabst ◽

T. Rossel

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Delay Faults ◽

Path Delay Faults ◽

Generation Algorithm

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