Optical-clock local-oscillator universal interrogation protocol for zero probe-field-induced frequency-shifts

AbstractOptical atomic clocks have already overcome the eighteenth decimal digit of instability and uncertainty, demonstrating incredible control over external perturbations of the clock transition frequency. At the same time, there is an increasing demand for atomic (ionic) transitions and new interrogation and readout protocols providing minimal sensitivity to external fields and possessing practical operational wavelengths. One of the goals is to simplify the clock operation while maintaining the relative uncertainty at a low 10−18 level achieved at the shortest averaging time. This is especially important for transportable and envisioned space-based optical clocks. Here, we demonstrate implementation of a synthetic frequency approach for a thulium optical clock with simultaneous optical interrogation of two clock transitions. Our experiment shows suppression of the quadratic Zeeman shift by at least three orders of magnitude. The effect of the tensor lattice Stark shift in thulium can also be reduced to below 10−18 in fractional frequency units. This makes the thulium optical clock almost free from hard-to-control systematic shifts. The “simultaneous” protocol demonstrates very low sensitivity to the cross-talks between individual clock transitions during interrogation and readout.

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Effect of trapped-ion heating on generalised Ramsey methods for suppressing frequency shifts caused by a probe field in atomic clocks

Quantum Electronics ◽

10.1070/qel17005 ◽

2019 ◽

Vol 49 (5) ◽

pp. 429-432

Author(s):

S N Kuznetsov ◽

A V Taichenachev ◽

V I Yudin ◽

N Huntemann ◽

C Sanner ◽

...

Keyword(s):

Atomic Clocks ◽

Ion Heating ◽

Probe Field ◽

Frequency Shifts ◽

Trapped Ion

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Evaluation of trap-induced systematic frequency shifts for a multi-ion optical clock at the 10−19level

Journal of Physics Conference Series ◽

10.1088/1742-6596/723/1/012027 ◽

2016 ◽

Vol 723 ◽

pp. 012027 ◽

Cited By ~ 16

Author(s):

J Keller ◽

T Burgermeister ◽

D Kalincev ◽

J Kiethe ◽

T E Mehlstäubler

Keyword(s):

Optical Clock ◽

Frequency Shifts

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Inter-channel uniformity of a microwave sounder in space

10.5194/amt-2017-405 ◽

2017 ◽

Author(s):

Martin Burgdorf ◽

Imke Hans ◽

Marc Prange ◽

Theresa Lang ◽

Stefan A. Buehler

Keyword(s):

Radio Frequency ◽

Local Oscillator ◽

Radio Frequency Interference ◽

The Moon ◽

Deep Space ◽

Calibration Target ◽

Frequency Shifts ◽

Microwave Sounding Unit ◽

Obvious Reason ◽

Microwave Sounding

Abstract. We analyzed intrusions of the Moon in the deep space view of the Advanced Microwave Sounding Unit-B on the NOAA-16 satellite and found no significant discrepancies in the signals from the different sounding channels between 2001 and 2008. Earlier investigations, however, had detected biases of up to 10 K by using simultaneous nadir overpasses of NOAA-16 with other satellites. These discrepancies in the observations of Earth scenes cannot be due to non-linearity of the receiver or contamination of the deep space view without affecting the signal from the Moon as well. As major anomalies of the on-board calibration target and frequency shifts of the local oscillator were not present, either, the most obvious reason for the degrading photometric stability is radio frequency interference in combination with a strongly decreasing gain. By means of the chosen example we demonstrate the usefulness of the Moon for investigations of the performance of microwave sounders in flight.

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Preferential Sputtering of Ni3Al Single Crystals Studied Using Atom-Probe Field-Ion Microscopy and XPS

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100096813 ◽

1981 ◽

Vol 39 ◽

pp. 16-17

Author(s):

M.P. Thomas ◽

A.R. Waugh ◽

M.J. Southon ◽

Brian Ralph

Keyword(s):

Single Crystals ◽

Photoelectron Spectroscopy ◽

Surface Composition ◽

Depth Profiling ◽

Analytical Techniques ◽

Atom Probe ◽

Probe Field ◽

Preferential Sputtering ◽

Argon Ion Bombardment ◽

Argon Ion

It is well known that ion-induced sputtering from numerous multicomponent targets results in marked changes in surface composition (1). Preferential removal of one component results in surface enrichment in the less easily removed species. In this investigation, a time-of-flight atom-probe field-ion microscope A.P. together with X-ray photoelectron spectroscopy XPS have been used to monitor alterations in surface composition of Ni3Al single crystals under argon ion bombardment. The A.P. has been chosen for this investigation because of its ability using field evaporation to depth profile through a sputtered surface without the need for further ion sputtering. Incident ion energy and ion dose have been selected to reflect conditions widely used in surface analytical techniques for cleaning and depth-profiling of samples, typically 3keV and 1018 - 1020 ion m-2.

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High-resolution x-ray imaging of small copper-rich precipitates in steels

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100104704 ◽

1988 ◽

Vol 46 ◽

pp. 528-529

Author(s):

J. R. Michael ◽

K. A. Taylor

Keyword(s):

Electron Microscopy ◽

Thermomechanical Processing ◽

Atom Probe ◽

Ferrite Matrix ◽

Scanning Transmission Electron Microscope ◽

Probe Field ◽

X Ray ◽

Subsequent Transformation ◽

Transmission Electron ◽

Scanning Transmission

Although copper is considered an incidental or trace element in many commercial steels, some grades contain up to 1-2 wt.% Cu for precipitation strengthening. Previous electron microscopy and atom-probe/field-ion microscopy (AP/FIM) studies indicate that the precipitation of copper from ferrite proceeds with the formation of Cu-rich bcc zones and the subsequent transformation of these zones to fcc copper particles. However, the similarity between the atomic scattering amplitudes for iron and copper and the small misfit between between Cu-rich particles and the ferrite matrix preclude the detection of small (<5 nm) Cu-rich particles by conventional transmission electron microscopy; such particles have been imaged directly only by FIM. Here results are presented whereby the Cu Kα x-ray signal was used in a dedicated scanning transmission electron microscope (STEM) to image small Cu-rich particles in a steel. The capability to detect these small particles is expected to be helpful in understanding the behavior of copper in steels during thermomechanical processing and heat treatment.

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A Comparison of Tem and Apfim to the Interpretation of Modulated Microstructures

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010011742x ◽

1985 ◽

Vol 43 ◽

pp. 70-71

Author(s):

M.G. Burke ◽

M.K. Miller

Keyword(s):

Low Temperature ◽

Microstructural Characterization ◽

Superlattice Reflection ◽

High Volume ◽

Atom Probe ◽

Dark Field ◽

Miscibility Gap ◽

Second Phase ◽

Two Phase ◽

Probe Field

Interpretation of fine-scale microstructures containing high volume fractions of second phase is complex. In particular, microstructures developed through decomposition within low temperature miscibility gaps may be extremely fine. This paper compares the morphological interpretations of such complex microstructures by the high-resolution techniques of TEM and atom probe field-ion microscopy (APFIM).The Fe-25 at% Be alloy selected for this study was aged within the low temperature miscibility gap to form a <100> aligned two-phase microstructure. This triaxially modulated microstructure is composed of an Fe-rich ferrite phase and a B2-ordered Be-enriched phase. The microstructural characterization through conventional bright-field TEM is inadequate because of the many contributions to image contrast. The ordering reaction which accompanies spinodal decomposition in this alloy permits simplification of the image by the use of the centered dark field technique to image just one phase. A CDF image formed with a B2 superlattice reflection is shown in fig. 1. In this CDF micrograph, the the B2-ordered Be-enriched phase appears as bright regions in the darkly-imaging ferrite. By examining the specimen in a [001] orientation, the <100> nature of the modulations is evident.

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