Using a reconfigurable field programmable gate array to demonstrate boundary scan with built in self test

2002 ◽  
Author(s):  
H.J. Pottinger ◽  
Chien-Yuh Lin
Keyword(s):  
Field Programmable Gate Array ◽  
Boundary Scan ◽  
Field Programmable ◽  
Self Test ◽  
Gate Array ◽  
Built In Self Test

scholarly journals A BIST Methodology to test CLB Resources on an SRAM-Based FPGA using Complementary Gates Configuration

2020 ◽  
Vol 9 (12) ◽  
pp. 217-220
Keyword(s):  
Field Programmable Gate Array ◽  
Test Pattern ◽  
Fault Coverage ◽  
Area Overhead ◽  
Field Programmable ◽  
Self Test ◽  
Gate Array ◽  
Built In Self Test ◽  
Pattern Generators ◽  
Logic Blocks

This paper primarily focuses on designing a new Built in self test (BIST) methodology to test the configurable logic blocks (CLBs) which is the heart of field programmable gate array (FPGA). The proposed methodology targets stuck-at-0/1 faults on a RAM cell in an LUT which constitutes about 90% of the total faults in the CLBs. No extra area overhead is needed to accommodate the test pattern generators (TPGs) and output responses analyzers (ORAs) as they are realized by the already existing configurable resources on the FPGA.A group of CLBs chosen as block under test (BUT) are configured as complementary gates (AND/NAND, OR/NOR, XOR/XNOR) to successfully test the aforementioned faults. The proposed BIST structure when implemented on Xilinx Virtex-4 FPGA proved 100% fault coverage and minimized test configurations.

Future Field Programmable Gate Array (FPGA) Design Methodologies and Tool Flows

2008 ◽  
Author(s):  
Michael Wirthlin ◽  
Brent Nelson ◽  
Brad Hutchings ◽  
Peter Athanas ◽  
Shawn Bohner
Keyword(s):  
Field Programmable Gate Array ◽  
Fpga Design ◽  
Design Methodologies ◽  
Field Programmable ◽  
Gate Array

Real-time signal processing in field programmable gate array based digital gamma-ray spectrometer

2020 ◽  
Vol 91 (10) ◽  
pp. 104707
Author(s):  
Yinyu Liu ◽  
Hao Xiong ◽  
Chunhui Dong ◽  
Chaoyang Zhao ◽  
Quanfeng Zhou ◽  
...  
Keyword(s):  
Signal Processing ◽  
Real Time ◽  
Field Programmable Gate Array ◽  
Gamma Ray ◽  
Time Signal ◽  
Gamma Ray Spectrometer ◽  
Field Programmable ◽  
Gate Array ◽  
Real Time Signal Processing
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