Call level performance analysis of 3/sup rd/ generation mobile core networks

Author(s):  
S. Racz ◽  
M. Telek ◽  
G. Fodor
2011 ◽  
Vol 88-89 ◽  
pp. 326-330 ◽  
Author(s):  
Jin Hui Wang ◽  
Na Gong ◽  
Gang Liu ◽  
Shu Qin Geng ◽  
Wu Chen Wu

The leakage current, active power and delay characterizations of the domino circuits in the presence of P-V-T (Process, Voltage, and Temperature) variations are analyzed based on multiple-parameter Monte Carlo method. It is demonstrated that failing to account for P-V-T variations and process-electro-thermal couplings can result in significant inaccuracy in transistor-level performance estimation. It also indicates that under significant P-V-T variations, DTV (Dual VtTechnology) is still highly effective to reduce the leakage current and active power for domino circuits, but induces speed penalty. At last, the robustness of different domino circuits with DTV against the P-V-T variations is discussed.


2017 ◽  
Vol 24 (8) ◽  
pp. 2927-2941 ◽  
Author(s):  
Árpád Drozdy ◽  
Jouko Kapanen ◽  
Jukka Manner

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