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Simulation based test generation for scan designs
IEEE/ACM International Conference on Computer Aided Design. ICCAD - 2000. IEEE/ACM Digest of Technical Papers (Cat. No.00CH37140)
◽
10.1109/iccad.2000.896529
◽
2002
◽
Cited By ~ 9
Author(s):
I. Pomeranz
◽
S.M. Reddy
Keyword(s):
Test Generation
◽
Simulation Based
Download Full-text
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Simulation-based Adversarial Test Generation for Autonomous Vehicles with Machine Learning Components
2018 IEEE Intelligent Vehicles Symposium (IV)
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10.1109/ivs.2018.8500421
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2018
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Cited By ~ 42
Author(s):
Cumhur Erkan Tuncali
◽
Georgios Fainekos
◽
Hisahiro Ito
◽
James Kapinski
Keyword(s):
Machine Learning
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Test Generation
◽
Autonomous Vehicles
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Simulation Based
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SIMULATION BASED LOW POWER TEST GENERATION FOR CROSSTALK DELAY FAULTS
International Journal of Modelling and Simulation
◽
10.2316/journal.205.2011.3.205-5524
◽
2011
◽
Vol 31
(3)
◽
Author(s):
Jayanthy Soundararajan
◽
Bhuvaneswari M. Chinnadurai
Keyword(s):
Low Power
◽
Test Generation
◽
Delay Faults
◽
Power Test
◽
Low Power Test
◽
Simulation Based
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An Agency-Directed Approach to Test Generation for Simulation-based Autonomous Vehicle Verification
2020 IEEE International Conference On Artificial Intelligence Testing (AITest)
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10.1109/aitest49225.2020.00012
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2020
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Author(s):
Greg Chance
◽
Abanoub Ghobrial
◽
Severin Lemaignan
◽
Tony Pipe
◽
Kerstin Eder
Keyword(s):
Test Generation
◽
Autonomous Vehicle
◽
Simulation Based
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Simulation-based functional test generation for embedded processors
Tenth IEEE International High-Level Design Validation and Test Workshop, 2005.
◽
10.1109/hldvt.2005.1568806
◽
2006
◽
Cited By ~ 1
Author(s):
C.H.-P. Wen
◽
L.-C. Wang
◽
Kwang-Ting Cheng
Keyword(s):
Test Generation
◽
Functional Test
◽
Embedded Processors
◽
Simulation Based
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Simulation-based target test generation techniques for improving the robustness of a software-based-self-test methodology
IEEE International Conference on Test, 2005.
◽
10.1109/test.2005.1584059
◽
2006
◽
Author(s):
Charles H.-P. Wen
◽
L.-C. Wang
◽
Kwang-Ting Cheng
◽
Wei-Ting Liu
◽
Ji-Jan Chen
Keyword(s):
Test Generation
◽
Test Methodology
◽
Simulation Based
◽
Self Test
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A Simulation-Based Test Generation Scheme Using Genetic Algorithms
The Sixth International Conference on VLSI Design
◽
10.1109/icvd.1993.669663
◽
2005
◽
Cited By ~ 23
Author(s):
M. Srinivas
◽
L.M. Patnaik
Keyword(s):
Genetic Algorithms
◽
Test Generation
◽
Simulation Based
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Parallel genetic algorithms for simulation-based sequential circuit test generation
Proceedings Tenth International Conference on VLSI Design
◽
10.1109/icvd.1997.568180
◽
2002
◽
Cited By ~ 9
Author(s):
D. Krishnaswamy
◽
M.S. Hsiao
◽
V. Saxena
◽
E.M. Rudnick
◽
J.H. Patel
◽
...
Keyword(s):
Genetic Algorithms
◽
Test Generation
◽
Sequential Circuit
◽
Parallel Genetic Algorithms
◽
Simulation Based
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Fault simulation based test generation for combinational circuits using dynamically selected subcircuits
Proceedings 1999 IEEE International Conference on Computer Design: VLSI in Computers and Processors (Cat. No.99CB37040)
◽
10.1109/iccd.1999.808575
◽
2003
◽
Cited By ~ 1
Author(s):
I. Pomeranz
◽
S.M. Reddy
Keyword(s):
Test Generation
◽
Fault Simulation
◽
Combinational Circuits
◽
Simulation Based
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Simulation Based Test Generation for Crosstalk Delay Faults in Asynchronous Sequential Circuits
Test Generation of Crosstalk Delay Faults in VLSI Circuits
◽
10.1007/978-981-13-2493-2_9
◽
2018
◽
pp. 141-150
Author(s):
S. Jayanthy
◽
M. C. Bhuvaneswari
Keyword(s):
Test Generation
◽
Sequential Circuits
◽
Delay Faults
◽
Simulation Based
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LOCSTEP: a logic-simulation-based test generation procedure
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
◽
10.1109/43.631218
◽
1997
◽
Vol 16
(5)
◽
pp. 544-554
◽
Cited By ~ 7
Author(s):
I. Pomeranz
◽
S.M. Reddy
Keyword(s):
Test Generation
◽
Logic Simulation
◽
Simulation Based
◽
Generation Procedure
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