Development of a high-precision surface metrology system and its uncertainty analysis

Author(s):  
Shih-Kang Kuo ◽  
Wen-Ho Yang ◽  
Chang-Ching Lin ◽  
Koung-Ming Yeh ◽  
Ming-June Tsai ◽  
...  
2020 ◽  
Vol 13 (4) ◽  
pp. 660-675
Author(s):  
ZHANG Shuai ◽  
◽  
◽  
HOU Xi ◽  
◽  
...  

2007 ◽  
Vol 3 (S248) ◽  
pp. 280-281
Author(s):  
Y. Niwa ◽  
K. Arai ◽  
A. Ueda ◽  
M. Sakagami ◽  
N. Gouda ◽  
...  

AbstractThe telescope geometry of JASMINE should be stabilized and monitored with the accuracy of about 10 to 100 pm or 10 to 100 prad of rms over about 10 hours. For this purpose, a high-precision interferometric laser metrology system is employed. Useful techniques for measuring displacements on extremely small scales are the wave-front sensing method and the heterodyne interferometrical method. Experiments for verification of measurement principles are well advanced.


2013 ◽  
Author(s):  
Ian Lacey ◽  
Nikolay A. Artemiev ◽  
Wayne R. McKinney ◽  
Daniel J. Merthe ◽  
Valeriy V. Yashchuk

2018 ◽  
Vol 156 (1) ◽  
pp. 20 ◽  
Author(s):  
Simon B. Porter ◽  
Marc W. Buie ◽  
Alex H. Parker ◽  
John R. Spencer ◽  
Susan Benecchi ◽  
...  

2011 ◽  
Author(s):  
Constanze Grossmann ◽  
Franziska Perske ◽  
Susanne Zwick ◽  
Judith Baumgarten ◽  
Bernd Richter ◽  
...  

2012 ◽  
Vol 2012 ◽  
pp. 1-9
Author(s):  
Constanze Großmann ◽  
Ute Gawronski ◽  
Martin Breibarth ◽  
Gunther Notni ◽  
Andreas Tünnermann

Innovative display technologies enable a wide range of different system applications. specifically, in metrology, medical, and automotive applications microdisplays were increasingly used. In the last decades OLED microdisplays were in the focus of display development. A new class of OLED microdisplays with an integrated photodiode array is the latest development. The so-called bi-directional OLED microdisplays combine light-emitting devices (AM-OLED microdisplay) and photo sensitive detectors (photodiode matrix) on one single chip based on OLED-on-CMOS-technology. Currently this kind of display is still a prototype. Based on such a novel bidirectional OLED microdisplay, we present for the first time a system simulation and design of a 3D optical surface metrology system. The first step is the full characterization of the microdisplay. Depending on the characterization results the future system parameters are determined. Based on the characterization results and the application parameters the system design parameters are defined. The functionality of the system is simulated, and a theoretical proof of concept is presented. An example for our application on 3D optical surface metrology system is evaluated.


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