A Defect Recognition System for Automated Inspection of Non-rigid Surfaces

Author(s):  
Sebastian von Enzberg ◽  
Ayoub Al-Hamadi
Author(s):  
M. H. Harun ◽  
M. F. Yaakub ◽  
A. F. Z. Abidin ◽  
A. H. Azahar ◽  
M. S. M. Aras ◽  
...  

<p>This paper investigates various approaches for automated inspection of gluing process using shape-based matching application. A new supervised defect detection approach to detect a class of defects in gluing application is proposed. Creating of region of interest in important region of object is discussed. Gaussian smoothing features is proposed in determining better image processing. Template matching in differentiates between reference and tested image are proposed. This scheme provides high computational savings and results in high defect detection recognition rate. The defects are broadly classified into three classes: 1) gap defect; 2) bumper defect; 3) bubble defect. This system does lessen execution time, yet additionally produce high precision in deformity location rate. It is discovered that the proposed framework can give precision at 95.77% recognition rate in recognizing imperfection for gluing application.</p>


2015 ◽  
Vol 70 ◽  
pp. 6-17 ◽  
Author(s):  
Chung-Feng Jeffrey Kuo ◽  
Kai-Ching Peng ◽  
Han-Cheng Wu ◽  
Ching-Chin Wang

2007 ◽  
Vol 58 (4) ◽  
pp. 355-366 ◽  
Author(s):  
Vincent Bombardier ◽  
Cyril Mazaud ◽  
Pascal Lhoste ◽  
Raphaël Vogrig

2013 ◽  
Vol 462-463 ◽  
pp. 155-158
Author(s):  
Gong Chen ◽  
Xi Fang Zhu ◽  
Qing Quan Xu ◽  
An Cheng Xu ◽  
Hui Yang

Lithium battery film on-line defect recognition system is realized based on industrial charge-coupled device (CCD) to improve quality. Otsu algorithm is adopted for threshold instead of traditional method. Area of defect is sorted to get the largest defect and geometry and projective is extracted from image. Film defects of lithium battery recognition is realized based on Brightness Judgment and One-against-all support vector machine (OAA-SVM). Experiment results show that these methods are effective and feasible, the accuracy can reach 90%.


2018 ◽  
Vol 1 (2) ◽  
pp. 34-44
Author(s):  
Faris E Mohammed ◽  
Dr. Eman M ALdaidamony ◽  
Prof. A. M Raid

Individual identification process is a very significant process that resides a large portion of day by day usages. Identification process is appropriate in work place, private zones, banks …etc. Individuals are rich subject having many characteristics that can be used for recognition purpose such as finger vein, iris, face …etc. Finger vein and iris key-points are considered as one of the most talented biometric authentication techniques for its security and convenience. SIFT is new and talented technique for pattern recognition. However, some shortages exist in many related techniques, such as difficulty of feature loss, feature key extraction, and noise point introduction. In this manuscript a new technique named SIFT-based iris and SIFT-based finger vein identification with normalization and enhancement is proposed for achieving better performance. In evaluation with other SIFT-based iris or SIFT-based finger vein recognition algorithms, the suggested technique can overcome the difficulties of tremendous key-point extraction and exclude the noise points without feature loss. Experimental results demonstrate that the normalization and improvement steps are critical for SIFT-based recognition for iris and finger vein , and the proposed technique can accomplish satisfactory recognition performance. Keywords: SIFT, Iris Recognition, Finger Vein identification and Biometric Systems.   © 2018 JASET, International Scholars and Researchers Association    


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