Effect of conductive filament morphology on soft error of oxide based Resistive Random Access Memory
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2020 ◽
Vol 12
(2)
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pp. 02008-1-02008-4
2018 ◽
Vol 10
(11)
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pp. 9802-9816
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2012 ◽
Vol 51
(6S)
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pp. 06FE06
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2013 ◽
Vol 52
(11R)
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pp. 114201
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