Divide-and-conquer in wafer scale array testing

Author(s):  
Y.-H. Choi ◽  
T. Jung
1988 ◽  
Vol 135 (6) ◽  
pp. 281
Author(s):  
J.B. Butcher ◽  
K.K. Johnstone

2019 ◽  
Vol 139 (7) ◽  
pp. 217-218
Author(s):  
Michitaka Yamamoto ◽  
Takashi Matsumae ◽  
Yuichi Kurashima ◽  
Hideki Takagi ◽  
Tadatomo Suga ◽  
...  

2011 ◽  
Vol 36 (12) ◽  
pp. 1697-1705 ◽  
Author(s):  
Rong-Chuan SUN ◽  
Shu-Gen MA ◽  
Bin LI ◽  
Ming-Hui WANG ◽  
Yue-Chao WANG
Keyword(s):  

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