Electrical degradation of InAlAs/InGaAs metamorphic high-electron mobility transistors
S.D. Mertens
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J.A. del Alamo
Dong-Seok Kim
◽
Jeong-Gil Kim
◽
Jun-Hyeok Lee
◽
Yong Seok Hwang
◽
Young Jun Yoon
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...
2010 ◽
Vol 40
(4)
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pp. 362-368
Valerio Di Lecce
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Michele Esposto
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Matteo Bonaiuti
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Fausto Fantini
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Gaudenzio Meneghesso
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...
2012 ◽
Vol 33
(5)
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pp. 054005
Yulong Fang
◽
Shaobo Dun
◽
Bo Liu
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Jiayun Yin
◽
Shujun Cai
◽
...
2011 ◽
Vol 58
(6)
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pp. 2918-2924
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Y. S. Puzyrev
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T. Roy
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E. X. Zhang
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D. M. Fleetwood
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R. D. Schrimpf
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...
Jungwoo Joh
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Jesus A. del Alamo
2010 ◽
Vol 50
(6)
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pp. 767-773
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Jungwoo Joh
◽
Feng Gao
◽
Tomás Palacios
◽
Jesús A. del Alamo
2008 ◽
Vol 29
(4)
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pp. 287-289
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Jungwoo Joh
◽
J.A. del Alamo
Jungwoo Joh
◽
Jesus A. del Alamo
2018 ◽
Vol 57
(7)
◽
pp. 074101
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Zhifeng Lei
◽
Hongxia Guo
◽
Minghua Tang
◽
Chao Peng
◽
Zhangang Zhang
◽
...
2010 ◽
Vol 96
(23)
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pp. 233509
◽
Prashanth Makaram
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Jungwoo Joh
◽
Jesús A. del Alamo
◽
Tomás Palacios
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Carl V. Thompson