Critical Voltage for Electrical Degradation of GaN High-Electron Mobility Transistors
2008 ◽
Vol 29
(4)
◽
pp. 287-289
◽
Jungwoo Joh
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J.A. del Alamo
2010 ◽
Vol 50
(6)
◽
pp. 767-773
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Jungwoo Joh
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Feng Gao
◽
Tomás Palacios
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Jesús A. del Alamo
Dong-Seok Kim
◽
Jeong-Gil Kim
◽
Jun-Hyeok Lee
◽
Yong Seok Hwang
◽
Young Jun Yoon
◽
...
2010 ◽
Vol 40
(4)
◽
pp. 362-368
Valerio Di Lecce
◽
Michele Esposto
◽
Matteo Bonaiuti
◽
Fausto Fantini
◽
Gaudenzio Meneghesso
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...
2019 ◽
Vol 41
(6)
◽
pp. 63-70
◽
Chien-Fong Lo
◽
Lu Liu
◽
Tsung-Sheng Kang
◽
Ryan Davies
◽
Brent P. Gila
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...
2012 ◽
Vol 33
(5)
◽
pp. 054005
Yulong Fang
◽
Shaobo Dun
◽
Bo Liu
◽
Jiayun Yin
◽
Shujun Cai
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...
2011 ◽
Vol 58
(6)
◽
pp. 2918-2924
◽
Y. S. Puzyrev
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T. Roy
◽
E. X. Zhang
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D. M. Fleetwood
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R. D. Schrimpf
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...
Jungwoo Joh
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Jesus A. del Alamo
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Jesus A. del Alamo
S.D. Mertens
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J.A. del Alamo