Time-optimal stepper motor motion profile through a novel load-angle-based step-command optimization

Author(s):  
David Ceulemans ◽  
Nick van Oosterwyck ◽  
Joris Demetsenaere ◽  
Jasper de Viaene ◽  
Jan Steckel ◽  
...  
2020 ◽  
Vol 17 (3) ◽  
pp. 172988142092004
Author(s):  
Yong-Lin Kuo ◽  
Chun-Chen Lin ◽  
Zheng-Ting Lin

This article presents a dual-optimization trajectory planning algorithm, which consists of the optimal path planning and the optimal motion profile planning for robot manipulators, where the path planning is based on parametric curves. In path planning, a virtual-knot interpolation is proposed for the paths required to pass through all control points, so the common curves, such as Bézier curves and B-splines, can be incorporated into it. Besides, an optimal B-spline is proposed to generate a smoother and shorter path, and this scheme is especially suitable for closed paths. In motion profile planning, a generalized formulation of time-optimal velocity profiles is proposed, which can be implemented to any types of motion profiles with equality and inequality constraints. Also, a multisegment cubic velocity profile is proposed by solving a multiobjective optimization problem. Furthermore, a case study of a dispensing robot is investigated through the proposed dual-optimization algorithm applied to numerical simulations and experimental work.


Author(s):  
F. Shaapur

Non-uniform ion-thinning of heterogenous material structures has constituted a fundamental difficulty in preparation of specimens for transmission electron microscopy (TEM). A variety of corrective procedures have been developed and reported for reducing or eliminating the effect. Some of these techniques are applicable to any non-homogeneous material system and others only to unidirectionalfy heterogeneous samples. Recently, a procedure of the latter type has been developed which is mainly based on a new motion profile for the specimen rotation during ion-milling. This motion profile consists of reversing partial revolutions (RPR) within a fixed sector which is centered around a direction perpendicular to the specimen heterogeneity axis. The ion-milling results obtained through this technique, as studied on a number of thin film cross-sectional TEM (XTEM) specimens, have proved to be superior to those produced via other procedures.XTEM specimens from integrated circuit (IC) devices essentially form a complex unidirectional nonhomogeneous structure. The presence of a variety of mostly lateral features at different levels along the substrate surface (consisting of conductors, semiconductors, and insulators) generally cause non-uniform results if ion-thinned conventionally.


2015 ◽  
Vol 19 (95) ◽  
pp. 24-27
Author(s):  
Elena S. Nazarova ◽  
◽  
Vladimir V. Osadchii ◽  
Sergej Ju. Tobolkin ◽  
◽  
...  
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