scholarly journals Low-Frequency Noise Measurements for Electromigration Characterization in BEOL Interconnects

Author(s):  
S. Beyne ◽  
K. Croes ◽  
O. Varela Pedreira ◽  
L. Arnoldi ◽  
M. H. van der Veen ◽  
...  
Measurement ◽  
2021 ◽  
pp. 109867
Author(s):  
Krzysztof ACHTENBERG ◽  
Janusz MIKOŁAJCZYK ◽  
Carmine CIOFI ◽  
Graziella SCANDURRA ◽  
Krystian MICHALCZEWSKI ◽  
...  

2003 ◽  
Vol 433-436 ◽  
pp. 677-680 ◽  
Author(s):  
Nobuhisa Tanuma ◽  
Hirokazu Tanizaki ◽  
Saburo Yokokura ◽  
T. Matsui ◽  
Sumihisa Hashiguchi ◽  
...  

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