Transistor aging and reliability in 14nm tri-gate technology

2015 IEEE International Reliability Physics Symposium ◽

10.1109/irps.2015.7112692 ◽

2015 ◽

Author(s):

S. Novak ◽

C. Parker ◽

D. Becher ◽

M. Liu ◽

M. Agostinelli ◽

...

Keyword(s):

Transistor Aging

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Impact of transistor aging effects on sense amplifier reliability in nano-scale CMOS

Thirteenth International Symposium on Quality Electronic Design (ISQED) ◽

10.1109/isqed.2012.6187515 ◽

2012 ◽

Author(s):

Roberto Menchaca ◽

Hamid Mahmoodi

Keyword(s):

Aging Effects ◽

Sense Amplifier ◽

Transistor Aging

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Modeling the evolution of conducted EMI of a buck converter after N-MOS transistor aging

2015 World Symposium on Mechatronics Engineering & Applied Physics (WSMEAP) ◽

10.1109/wsmeap.2015.7338213 ◽

2015 ◽

Author(s):

Mohamed Tlig ◽

Jaleleddine Ben Hadj Slama

Keyword(s):

Buck Converter ◽

Mos Transistor ◽

Conducted Emi ◽

Transistor Aging

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A self-adaptive system architecture to address transistor aging

2009 Design, Automation & Test in Europe Conference & Exhibition ◽

10.1109/date.2009.5090637 ◽

2009 ◽

Author(s):

O. Khan ◽

S. Kundu

Keyword(s):

System Architecture ◽

Adaptive System ◽

Adaptive System Architecture ◽

Self Adaptive ◽

Transistor Aging

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Testing for Transistor Aging

2009 27th IEEE VLSI Test Symposium ◽

10.1109/vts.2009.56 ◽

2009 ◽

Author(s):

Altug Hakan Baba ◽

Subhasish Mitra

Keyword(s):

Transistor Aging

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A physics-aware compact modeling framework for transistor aging in the entire bias space

2019 IEEE International Electron Devices Meeting (IEDM) ◽

10.1109/iedm19573.2019.8993603 ◽

2019 ◽

Author(s):

Zhicheng Wu ◽

Dimitri Linten ◽

Ben Kaczer ◽

Jacopo Franco ◽

Philippe J. Roussel ◽

...

Keyword(s):

Compact Modeling ◽

Modeling Framework ◽

Transistor Aging

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Transistor aging-induced degradation of analog circuits: Impact analysis and design guidelines

2011 Proceedings of the ESSCIRC (ESSCIRC) ◽

10.1109/esscirc.2011.6044952 ◽

2011 ◽

Author(s):

Elie Maricau ◽

Georges Gielen

Keyword(s):

Analog Circuits ◽

Impact Analysis ◽

Design Guidelines ◽

Analysis And Design ◽

Transistor Aging

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ExtraTime: Modeling and analysis of wearout due to transistor aging at microarchitecture-level

IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2012) ◽

10.1109/dsn.2012.6263957 ◽

2012 ◽

Author(s):

Fabian Oboril ◽

Mehdi B. Tahoori

Keyword(s):

Modeling And Analysis ◽

Transistor Aging

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SWAT: Simulator for Waveform-Accurate Timing Including Parameter Variations and Transistor Aging

Integrated Circuit and System Design. Power and Timing Modeling, Optimization, and Simulation - Lecture Notes in Computer Science ◽

10.1007/978-3-642-24154-3_20 ◽

2011 ◽

pp. 193-203

Author(s):

Christoph Knoth ◽

Carsten Uphoff ◽

Sebastian Kiesel ◽

Ulf Schlichtmann

Keyword(s):

Parameter Variations ◽

Transistor Aging

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Impact of Transistor Aging on the Reliability of the Analog Circuit

2020 International Conference on Computational Performance Evaluation (ComPE) ◽

10.1109/compe49325.2020.9200055 ◽

2020 ◽

Author(s):

Abhishek Bhattacharjee ◽

Sambhu Nath Pradhan

Keyword(s):

Analog Circuit ◽

Transistor Aging

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A Failure Prediction Strategy for Transistor Aging

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2011.2165304 ◽

2012 ◽

Vol 20 (11) ◽

pp. 1951-1959 ◽

Author(s):

Hyunbean Yi ◽

Tomokazu Yoneda ◽

Michiko Inoue ◽

Yasuo Sato ◽

Seiji Kajihara ◽

...

Keyword(s):

Failure Prediction ◽

Prediction Strategy ◽

Transistor Aging

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