ScienceGate
Advanced Search
Author Search
Journal Finder
Blog
Sign in / Sign up
ScienceGate
Search
Author Search
Journal Finder
Blog
Sign in / Sign up
Testing for Transistor Aging
2009 27th IEEE VLSI Test Symposium
◽
10.1109/vts.2009.56
◽
2009
◽
Cited By ~ 43
Author(s):
Altug Hakan Baba
◽
Subhasish Mitra
Keyword(s):
Transistor Aging
Download Full-text
Related Documents
Cited By
References
Impact of transistor aging effects on sense amplifier reliability in nano-scale CMOS
Thirteenth International Symposium on Quality Electronic Design (ISQED)
◽
10.1109/isqed.2012.6187515
◽
2012
◽
Cited By ~ 14
Author(s):
Roberto Menchaca
◽
Hamid Mahmoodi
Keyword(s):
Aging Effects
◽
Sense Amplifier
◽
Nano Scale
◽
Transistor Aging
Download Full-text
Modeling the evolution of conducted EMI of a buck converter after N-MOS transistor aging
2015 World Symposium on Mechatronics Engineering & Applied Physics (WSMEAP)
◽
10.1109/wsmeap.2015.7338213
◽
2015
◽
Author(s):
Mohamed Tlig
◽
Jaleleddine Ben Hadj Slama
Keyword(s):
Buck Converter
◽
Mos Transistor
◽
Conducted Emi
◽
Transistor Aging
Download Full-text
A self-adaptive system architecture to address transistor aging
2009 Design, Automation & Test in Europe Conference & Exhibition
◽
10.1109/date.2009.5090637
◽
2009
◽
Cited By ~ 32
Author(s):
O. Khan
◽
S. Kundu
Keyword(s):
System Architecture
◽
Adaptive System
◽
Adaptive System Architecture
◽
Self Adaptive
◽
Transistor Aging
Download Full-text
A physics-aware compact modeling framework for transistor aging in the entire bias space
2019 IEEE International Electron Devices Meeting (IEDM)
◽
10.1109/iedm19573.2019.8993603
◽
2019
◽
Author(s):
Zhicheng Wu
◽
Dimitri Linten
◽
Ben Kaczer
◽
Jacopo Franco
◽
Philippe J. Roussel
◽
...
Keyword(s):
Compact Modeling
◽
Modeling Framework
◽
Transistor Aging
Download Full-text
Transistor aging-induced degradation of analog circuits: Impact analysis and design guidelines
2011 Proceedings of the ESSCIRC (ESSCIRC)
◽
10.1109/esscirc.2011.6044952
◽
2011
◽
Cited By ~ 25
Author(s):
Elie Maricau
◽
Georges Gielen
Keyword(s):
Analog Circuits
◽
Impact Analysis
◽
Design Guidelines
◽
Analysis And Design
◽
Transistor Aging
Download Full-text
Transistor aging and reliability in 14nm tri-gate technology
2015 IEEE International Reliability Physics Symposium
◽
10.1109/irps.2015.7112692
◽
2015
◽
Cited By ~ 24
Author(s):
S. Novak
◽
C. Parker
◽
D. Becher
◽
M. Liu
◽
M. Agostinelli
◽
...
Keyword(s):
Transistor Aging
Download Full-text
ExtraTime: Modeling and analysis of wearout due to transistor aging at microarchitecture-level
IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2012)
◽
10.1109/dsn.2012.6263957
◽
2012
◽
Cited By ~ 40
Author(s):
Fabian Oboril
◽
Mehdi B. Tahoori
Keyword(s):
Modeling And Analysis
◽
Transistor Aging
Download Full-text
SWAT: Simulator for Waveform-Accurate Timing Including Parameter Variations and Transistor Aging
Integrated Circuit and System Design. Power and Timing Modeling, Optimization, and Simulation - Lecture Notes in Computer Science
◽
10.1007/978-3-642-24154-3_20
◽
2011
◽
pp. 193-203
Author(s):
Christoph Knoth
◽
Carsten Uphoff
◽
Sebastian Kiesel
◽
Ulf Schlichtmann
Keyword(s):
Parameter Variations
◽
Transistor Aging
Download Full-text
Impact of Transistor Aging on the Reliability of the Analog Circuit
2020 International Conference on Computational Performance Evaluation (ComPE)
◽
10.1109/compe49325.2020.9200055
◽
2020
◽
Author(s):
Abhishek Bhattacharjee
◽
Sambhu Nath Pradhan
Keyword(s):
Analog Circuit
◽
Transistor Aging
Download Full-text
A Failure Prediction Strategy for Transistor Aging
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
◽
10.1109/tvlsi.2011.2165304
◽
2012
◽
Vol 20
(11)
◽
pp. 1951-1959
◽
Cited By ~ 15
Author(s):
Hyunbean Yi
◽
Tomokazu Yoneda
◽
Michiko Inoue
◽
Yasuo Sato
◽
Seiji Kajihara
◽
...
Keyword(s):
Failure Prediction
◽
Prediction Strategy
◽
Transistor Aging
Download Full-text
Sign in / Sign up
Close
Export Citation Format
Close
Share Document
Close