Limitations and accuracy of steady state technique for thermal characterization of thermal interface materials and substrates

Author(s):  
Mohamad AboRas ◽  
Daniel May ◽  
Ralph Schacht ◽  
Thomas Winkler ◽  
Sven Rzepka ◽  
...  
Author(s):  
Benjamin Sponagle ◽  
Dominic Groulx

One method for characterizing the contact conductance of Thermal Interface Materials (TIMs) is the steady state one dimensional heat flow method typified by ASTM D5470. A test apparatus and procedure were developed which use the basic theory of steady state testing TIMs and improves upon the accuracy and repeatability of the standard test. This procedure and apparatus were used to test the contact conductance of the interface four commercial available TIMs. These materials include: Laird Tflex 720, Laird Tmate 2905c, Chomerics Cho-Therm T500, and Chomerics Cho-Therm 1671. It was found that the Laird products underperformed the available manufacturer published values and the Chomerics products only met performance expectations at relatively high clamping pressures (400 psi).


2008 ◽  
Vol 32 (3) ◽  
pp. 48-52 ◽  
Author(s):  
C.I. Chen ◽  
C.Y. Ni ◽  
C.M. Chang ◽  
D.S. Liu ◽  
H.Y. Pan ◽  
...  

2012 ◽  
Vol 134 (2) ◽  
Author(s):  
Joseph R. Wasniewski ◽  
David H. Altman ◽  
Stephen L. Hodson ◽  
Timothy S. Fisher ◽  
Anuradha Bulusu ◽  
...  

The next generation of thermal interface materials (TIMs) are currently being developed to meet the increasing demands of high-powered semiconductor devices. In particular, a variety of nanostructured materials, such as carbon nanotubes (CNTs), are interesting due to their ability to provide low resistance heat transport from device-to-spreader and compliance between materials with dissimilar coefficients of thermal expansion (CTEs), but few application-ready configurations have been produced and tested. Recently, we have undertaken major efforts to develop functional nanothermal interface materials (nTIMs) based on short, vertically aligned CNTs grown on both sides of a thin interposer foil and interfaced with substrate materials via metallic bonding. A high-precision 1D steady-state test facility has been utilized to measure the performance of nTIM samples, and more importantly, to correlate performance to the controllable parameters. In this paper, we describe our material structures and the myriad permutations of parameters that have been investigated in their design. We report these nTIM thermal performance results, which include a best to-date thermal interface resistance measurement of 3.5 mm2 K/W, independent of applied pressure. This value is significantly better than a variety of commercially available, high-performance thermal pads and greases we tested, and compares favorably with the best results reported for CNT-based materials in an application-representative setting.


2016 ◽  
Vol 138 (4) ◽  
Author(s):  
Andrew N. Smith ◽  
Nicholas R. Jankowski ◽  
Lauren M. Boteler

Thermal interface materials (TIMs) have reached values approaching the measurement uncertainty of standard ASTM D5470 based testers of approximately ±1 × 10−6 m2 K/W. This paper presents a miniature ASTM-type steady-state tester that was developed to address the resolution limits of standard testers by reducing the heat meter bar thickness and using infrared (IR) thermography to measure the temperature gradient along the heat meter bar. Thermal interfacial resistance measurements on the order of 1 × 10−6 m2 K/W with an order of magnitude improvement in the uncertainty of ±1 × 10−7 m2 K/W are demonstrated. These measurements were made on several TIMs with a thermal resistance as low as 1.14 × 10−6 m2 K/W.


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