Focus performance of the electron beam in a surface-conduction field emission structure

2009 ◽  
Author(s):  
Xiaobo Zhu ◽  
Wei Lei ◽  
Ke Qu ◽  
Yunyan Chi ◽  
Xiaobing Zhang
Keyword(s):  
Electron Beam ◽  
Field Emission ◽  
Surface Conduction

Electron holography of p-n junctions

1996 ◽  
Vol 54 ◽  
pp. 974-975
Author(s):  
B.G. Frost ◽  
D.C. Joy ◽  
L.F. Allard ◽  
E. Voelkl
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Field Emission ◽  
Ccd Camera ◽  
Image Plane ◽  
Reference Wave ◽  
Field Of View ◽  
Control Mode ◽  
Objective Lens ◽  
Electron Holography

A wide holographic field of view (up to 15 μm in the Hitachi-HF2000) is achieved in a TEM by switching off the objective lens and imaging the sample by the first intermediate lens. Fig.1 shows the corresponding ray diagram for low magnification image plane off-axis holography. A coherent electron beam modulated by the sample in its amplitude and its phase is superimposed on a plane reference wave by a negatively biased Möllenstedt-type biprism.Our holograms are acquired utilizing a Hitachi HF-2000 field emission electron microscope at 200 kV. Essential for holography are a field emission gun and an electron biprism. At low magnification, the excitation of each lens must be appropriately adjusted by the free lens control mode of the microscope. The holograms are acquired by a 1024 by 1024 slow-scan CCD-camera and processed by the “Holoworks” software. The hologram fringes indicate positively and negatively charged areas in a sample by the direction of the fringe bending (Fig.2).

Field-emission properties of novel palladium nanogaps for surface conduction electron-emitters

2007 ◽  
Vol 18 (47) ◽  
pp. 475708 ◽  
Author(s):  
Hsiang-Yu Lo ◽  
Yiming Li ◽  
Hsueh-Yung Chao ◽  
Chih-Hao Tsai ◽  
Fu-Ming Pan
Keyword(s):  
Field Emission ◽  
Conduction Electron ◽  
Emission Properties ◽  
Field Emission Properties ◽  
Electron Emitters ◽  
Surface Conduction

Field emission from an electron-beam irradiated C60 film

2002 ◽  
Vol 92 (12) ◽  
pp. 7302-7305 ◽  
Author(s):  
Toshiki Hara ◽  
Jun Onoe ◽  
Kazuo Takeuchi
Keyword(s):  
Electron Beam ◽  
Field Emission

Field Emission Dependence on Nanogap Separation in Surface Conduction Electron-Emitter Display

2008 ◽  
Author(s):  
Yiming Li ◽  
Yi-Ting Kuo ◽  
Hsiang-Yu Lo ◽  
Hui-Wen Cheng ◽  
Ta-Ching Yeh ◽  
...  
Keyword(s):  
Field Emission ◽  
Conduction Electron ◽  
Electron Emitter ◽  
Surface Conduction

Stable field emission for electron beam illumination

1976 ◽  
Vol 57 (2) ◽  
pp. 667-678 ◽  
Author(s):  
S. Ranc ◽  
M. Pitaval ◽  
G. Fontaine
Keyword(s):  
Electron Beam ◽  
Field Emission ◽  
Stable Field

Enhanced Field Emission from Compound Emitters of Carbon Nanotubes and ZnO Tetrapods by Electron Beam Bombardment

2011 ◽  
Vol 11 (6) ◽  
pp. 4968-4980
Author(s):  
Lei Wei ◽  
Xiaobing Zhang ◽  
Chaogang Lou ◽  
Zhiwei Zhao ◽  
Chen Jing ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Electron Beam ◽  
Field Emission
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