Stable field emission for electron beam illumination

1976 ◽  
Vol 57 (2) ◽  
pp. 667-678 ◽  
Author(s):  
S. Ranc ◽  
M. Pitaval ◽  
G. Fontaine
Author(s):  
W.R. Bottoms ◽  
G.B. Haydon

There is great interest in improving the brightness of electron sources and therefore the ability of electron optical instrumentation to probe the properties of materials. Extensive work by Dr. Crew and others has provided extremely high brightness sources for certain kinds of analytical problems but which pose serious difficulties in other problems. These sources cannot survive in conventional system vacuums. If one wishes to gather information from the other signal channels activated by electron beam bombardment it is necessary to provide sufficient current to allow an acceptable signal-to-noise ratio. It is possible through careful design to provide a high brightness field emission source which has the capability of providing high currents as well as high current densities to a specimen. In this paper we describe an electrode to provide long-lived stable current in field emission sources.The source geometry was based upon the results of extensive computer modeling. The design attempted to maximize the total current available at a specimen.


Author(s):  
B.G. Frost ◽  
D.C. Joy ◽  
L.F. Allard ◽  
E. Voelkl

A wide holographic field of view (up to 15 μm in the Hitachi-HF2000) is achieved in a TEM by switching off the objective lens and imaging the sample by the first intermediate lens. Fig.1 shows the corresponding ray diagram for low magnification image plane off-axis holography. A coherent electron beam modulated by the sample in its amplitude and its phase is superimposed on a plane reference wave by a negatively biased Möllenstedt-type biprism.Our holograms are acquired utilizing a Hitachi HF-2000 field emission electron microscope at 200 kV. Essential for holography are a field emission gun and an electron biprism. At low magnification, the excitation of each lens must be appropriately adjusted by the free lens control mode of the microscope. The holograms are acquired by a 1024 by 1024 slow-scan CCD-camera and processed by the “Holoworks” software. The hologram fringes indicate positively and negatively charged areas in a sample by the direction of the fringe bending (Fig.2).


Nanoscale ◽  
2021 ◽  
Author(s):  
Shuai Tang ◽  
Jie Tang ◽  
Yimeng Wu ◽  
You-Hu Chen ◽  
Jun Uzuhashi ◽  
...  

A single CeB6 nanoneedle structure has been fabricated using a focused ion beam (FIB) and it shows an excellent field emission current stability as well as a single emission spot.


2013 ◽  
Vol 24 (6) ◽  
pp. 065201 ◽  
Author(s):  
Myung-Gyu Kang ◽  
Henri J Lezec ◽  
Fred Sharifi

2002 ◽  
Vol 92 (12) ◽  
pp. 7302-7305 ◽  
Author(s):  
Toshiki Hara ◽  
Jun Onoe ◽  
Kazuo Takeuchi
Keyword(s):  

2006 ◽  
Vol 963 ◽  
Author(s):  
Sigen Wang ◽  
Sha Chang

ABSTRACTCarbon nanotubes (CNTs) have been investigated as field emission electron sources for a number of applications such as x-ray source and microwave power amplifier. These applications often require that nanotubes provide a stable field emission at a high emission current. In this paper, we investigated the emission stability of CNTs as functions of hydrogen post-treatment and duty factor. The experimental results show that the hydrogen plasma treatment and a reduced duty cycle from 100% to 35% can noticeably improve the emission stability of CNTs at a high current value of 4 mA. Our study also shows that emission induced anode heating at high duty factor and high emission current level degrades vacuum level and thus the emission stability of CNTs.


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