Exact eigenstates of a nanoscopic paraboloidal emitter: Field emission quantities and spot size of the near field electron microscope

2017 ◽  
Author(s):  
A. Chatziafratis ◽  
G. Fikioris ◽  
J. P. Xanthakis
Keyword(s):  
Electron Microscope ◽  
Field Emission ◽  
Near Field ◽  
Spot Size ◽  
Field Electron

scholarly journals Exact eigenstates of a nanometric paraboloidal emitter and field emission quantities

2018 ◽  
Vol 474 (2214) ◽  
pp. 20170692 ◽  
Author(s):  
A. Chatziafratis ◽  
G. Fikioris ◽  
J. P. Xanthakis
Keyword(s):  
Schrödinger Equation ◽  
Field Emission ◽  
Schrodinger Equation ◽  
Near Field ◽  
Plane Waves ◽  
Spot Size ◽  
Emission Angle ◽  
Electron Velocity ◽  
Cartesian Geometry ◽  
Tip Radius

The progress in field emission theory from its initial Fowler–Nordheim form is centred on the transmission coefficient. For the supply (of electrons) function one still uses the constant value due to a supply of plane-waves states. However, for emitting tips of apex radius of 1–5 nm this is highly questionable. To address this issue, we have solved the Schrödinger equation in a sharp paraboloidally shaped quantum box. The Schrödinger equation is separable in the rotationally parabolic coordinate system and we hence obtain the exact eigenstates of the system. Significant differences from the usual Cartesian geometry are obtained. (1) Both the normally incident and parallel electron fluxes are functions of the angle to the emitter axis and affect the emission angle. (2) The WKB approximation fails for this system. (3) The eigenfunctions of the nanoemitter form a continuum only in one dimension while complete discretization occurs in the other two directions. (4) The parallel electron velocity vanishes at the apex which may explain the recent spot-size measurements in near-field scanning electron microscopy. (5) Competing effects are found as the tip radius decreases to 1 nm: The electric field increases but the total supply function decreases so that possibly an optimum radius exists.

Electron back-scattering patterns in a field emission gun scanning electron microscope

1978 ◽  
Vol 36 (1) ◽  
pp. 564-565
Author(s):  
C.J. Harland ◽  
J.H. Klein ◽  
P. Akhter ◽  
J.A. Venables
Keyword(s):  
Electron Microscope ◽  
Field Emission ◽  
Polycrystalline Material ◽  
High Vacuum ◽  
Spot Size ◽  
Ultra High Vacuum ◽  
Scattering Pattern ◽  
Fluorescent Screen ◽  
Back Scattering ◽  
Scanning Electron

INTRODUCTION.The electron back-scattering pattern (EBSP) is a simple means of obtaining the crystallographic orientation of samples in the SEM. Kikuchi bands are observed on a fluorescent screen ∼15mm in front of a (tilted) sample /l/ and shadows, for example of three spherical balls, can be used to obtain orientation determinations accurate to ± 0. 5° /2/. We have also shown that a fibre-optic detector of angular diameter <2θB can be used to form images of polycrystalline material with markedly increased grain contrast /3/.In the present paper we report that these techniques have been transferred onto an ultra-high vacuum SEM equipped with a field emission gun (FEG). The higher brightness of the FEG enables the spot size to be reduced markedly. The transition between the orientation of one grain and the next has been shown to be as sharp as 50nm. Shifts due to sub-grain boundaries down to ∼1° can be readily seen

Scanning EM in very high electric fields near field ion/emission specimens

1995 ◽  
Vol 53 ◽  
pp. 624-625
Author(s):  
David J. Larson ◽  
Patrick P. Camus ◽  
Thomas F. Kelly
Keyword(s):  
Electron Microscope ◽  
Field Emission ◽  
Electric Fields ◽  
Near Field ◽  
Atom Probe ◽  
Emission Source ◽  
Probe Field ◽  
High Electric Fields ◽  
Scanning Em ◽  
Ion Emission

An atom probe field ion microscope (APFIM) has been constructed inside a NORAN Instruments Automated Digital Electron Microscope (ADEM). The ADEM is a scanning electron microscope (SEM) with a field emission source and a very large vacuum chamber. The APFIM has positive and negative high voltage capability and uses a microchannel-plate/phosphor screen assembly as an imaging and single-ion detector. The APFIM specimen can be cooled by a cryogenic refrigerator. The motivation for this study was the need to deliver an electron beam to the apex of an APFIM specimen while a high field is applied. The beam will be used to thermally pulse the field evaporation rate. The expected field-induced image shift and distortion has been studied previously in a transmission EM with a liquid metal field emission source as a specimen.Fig. 1 shows the interior of the instrument. Computer simulations were done for electron trajectories with negative and positive voltages applied to the emitter based on a simple paraboloidal electric field model described previously.

scholarly journals On the Field Emission from Ni, Gd, and EuS Evaporated on to Tungsten

1970 ◽  
Vol 25 (12) ◽  
pp. 1981-1982 ◽  
Author(s):  
W. Eckstein ◽  
K.F. Georg ◽  
W. Heiland ◽  
J. Kirschner ◽  
N. Müller
Keyword(s):  
Electron Microscope ◽  
Field Emission ◽  
Polarized Electrons ◽  
Field Electron ◽  
Spin Polarized ◽  
Work Functions

AbstractTungsten tips coated with Ni, Gd and EuS are studied in a field electron microscope. Reproducible patterns are observed. The Gd-patterns show epitaxy with the W-substrate. With tempered tips the work functions are: Ni 5.1 ± 0.3 eV, Gd 3.2 ± 0.3 e V and EuS 3.1 ± 0.3eV. For the production of polarized electrons by field emission from materials with spin polarized bandstructure 1 - 4 the field emission from Gd, Ni and EuS is of interest.

Utilizing Dark Field Electron Microscopy to Produce Lantern Slides

1974 ◽  
Vol 32 ◽  
pp. 116-117
Author(s):  
J. N. Meador ◽  
C. N. Sun ◽  
H. J. White
Keyword(s):  
Electron Microscope ◽  
Electron Micrographs ◽  
Dark Field ◽  
Limiting Factor ◽  
Clinical Laboratories ◽  
Field Electron ◽  
Time Element ◽  
Field Electron Microscopy ◽  
Dark Field Electron ◽  
Dark Field Micrographs

The electron microscope is being utilized more and more in clinical laboratories for pathologic diagnosis. One of the major problems in the utilization of the electron microscope for diagnostic purposes is the time element involved. Recent experimentation with rapid embedding has shown that this long phase of the process can be greatly shortened. In rush cases the making of projection slides can be eliminated by taking dark field electron micrographs which show up as a positive ready for use. The major limiting factor for use of dark field micrographs is resolution. However, for conference purposes electron micrographs are usually taken at 2.500X to 8.000X. At these low magnifications the resolution obtained is quite acceptable.

Field Emission SEM Equipped With Noise Compensator

1973 ◽  
Vol 31 ◽  
pp. 302-303
Author(s):  
S. Saito ◽  
H. Todokoro ◽  
S. Nomura ◽  
T. Komoda
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Low Contrast ◽  
Probe Current ◽  
High Resolution Images ◽  
Scanning Electron

Field emission scanning electron microscope (FESEM) features extremely high resolution images, and offers many valuable information. But, for a specimen which gives low contrast images, lateral stripes appear in images. These stripes are resulted from signal fluctuations caused by probe current noises. In order to obtain good images without stripes, the fluctuations should be less than 1%, especially for low contrast images. For this purpose, the authors realized a noise compensator, and applied this to the FESEM.Fig. 1 shows an outline of FESEM equipped with a noise compensator. Two apertures are provided gust under the field emission gun.

A Field Emission System For Transmission Electron Microscopy

1973 ◽  
Vol 31 ◽  
pp. 298-299
Author(s):  
Michel Troyonal ◽  
Huei Pei Kuoal ◽  
Benjamin M. Siegelal
Keyword(s):  
Electron Microscope ◽  
Field Emission ◽  
Optical System ◽  
High Vacuum ◽  
Ultra High Vacuum ◽  
Objective Lens ◽  
Electron Optical System ◽  
Cross Sectional ◽  
Transmission Electron ◽  
Emission System

A field emission system for our experimental ultra high vacuum electron microscope has been designed, constructed and tested. The electron optical system is based on the prototype whose performance has already been reported. A cross-sectional schematic illustrating the field emission source, preaccelerator lens and accelerator is given in Fig. 1. This field emission system is designed to be used with an electron microscope operated at 100-150kV in the conventional transmission mode. The electron optical system used to control the imaging of the field emission beam on the specimen consists of a weak condenser lens and the pre-field of a strong objective lens. The pre-accelerator lens is an einzel lens and is operated together with the accelerator in the constant angular magnification mode (CAM).

A High Resolution Scanning Microscope

1968 ◽  
Vol 26 ◽  
pp. 356-357
Author(s):  
A. V. Crewe ◽  
J. Wall ◽  
L. M. Welter
Keyword(s):  
High Resolution ◽  
Field Emission ◽  
Spherical Aberration ◽  
Focal Length ◽  
Spot Size ◽  
Emission Source ◽  
Field Of View ◽  
Scanning Microscope ◽  
Magnetic Lens ◽  
High Quality

A scanning microscope using a field emission source has been described elsewhere. This microscope has now been improved by replacing the single magnetic lens with a high quality lens of the type described by Ruska. This lens has a focal length of 1 mm and a spherical aberration coefficient of 0.5 mm. The final spot size, and therefore the microscope resolution, is limited by the aberration of this lens to about 6 Å.The lens has been constructed very carefully, maintaining a tolerance of + 1 μ on all critical surfaces. The gun is prealigned on the lens to form a compact unit. The only mechanical adjustments are those which control the specimen and the tip positions. The microscope can be used in two modes. With the lens off and the gun focused on the specimen, the resolution is 250 Å over an undistorted field of view of 2 mm. With the lens on,the resolution is 20 Å or better over a field of view of 40 microns. The magnification can be accurately varied by attenuating the raster current.

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