Thermomigration-Based Junction Isolation of Bulk Silicon MEMS Devices
2006 ◽
Vol 15
(5)
◽
pp. 1131-1138
◽
2004 ◽
Vol 15
(3)
◽
pp. 535-542
◽
2017 ◽
Vol 137
(1)
◽
pp. 46-47
2001 ◽