Test structures and DRIE topography for bulk silicon MEMS devices

Author(s):  
Yong Ruan ◽  
Dacheng Zhang ◽  
Xuefeng He ◽  
Yangyuan Wang
Keyword(s):  
2017 ◽  
Vol 137 (1) ◽  
pp. 46-47
Author(s):  
Takeshi Kohno ◽  
Masato Mihara ◽  
Ataru Tanabe ◽  
Takashi Abe ◽  
Masanori Okuyama ◽  
...  

2000 ◽  
Author(s):  
D. J. Chang ◽  
S. T. Amimoto ◽  
A. D. Birkitt
Keyword(s):  

2001 ◽  
Author(s):  
A. D. Johnson ◽  
Vikas Gupta
Keyword(s):  

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