Call for Papers: Special Issue on IR-Drop and Power Supply Noise Effects on Design and Test of Very Deep-Submicron Designs

IEEE Design & Test of Computers ◽

10.1109/mdt.2006.115 ◽

2006 ◽

Vol 23 (5) ◽

pp. 413-413

Keyword(s):

Power Supply ◽

Deep Submicron ◽

Power Supply Noise ◽

Special Issue ◽

Noise Effects ◽

Ir Drop ◽

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Call for Papers: Special Issue on IR-Drop and Power Supply Noise Effects on Design and Test of Very Deep-Submicron Designs

IEEE Design & Test of Computers ◽

10.1109/mdt.2006.89 ◽

2006 ◽

Vol 23 (4) ◽

pp. 267-267

Keyword(s):

Power Supply ◽

Deep Submicron ◽

Power Supply Noise ◽

Special Issue ◽

Noise Effects ◽

Ir Drop ◽

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Layout-Aware Critical Path Delay Test Under Maximum Power Supply Noise Effects

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2011.2163159 ◽

2011 ◽

Vol 30 (12) ◽

pp. 1923-1934 ◽

Author(s):

Junxia Ma ◽

Mohammad Tehranipoor

Keyword(s):

Power Supply ◽

Critical Path ◽

Maximum Power ◽

Power Supply Noise ◽

Noise Effects ◽

Critical Path Delay ◽

Supply Noise ◽

Path Delay Test

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Delay testing considering power supply noise effects

International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034) ◽

10.1109/test.1999.805629 ◽

2003 ◽

Author(s):

A. Krstic ◽

Yi-Min Jiang ◽

Kwang-Ting Cheng

Keyword(s):

Power Supply ◽

Delay Testing ◽

Power Supply Noise ◽

Noise Effects ◽

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An analytical propagation delay model with power supply noise effects

2006 IEEE International Conference on Acoustics Speed and Signal Processing Proceedings ◽

10.1109/iscas.2006.1692664 ◽

2006 ◽

Author(s):

M. Pude ◽

C. Washburn ◽

P.R. Mukund ◽

K. Abe ◽

Y. Nishi

Keyword(s):

Power Supply ◽

Propagation Delay ◽

Delay Model ◽

Power Supply Noise ◽

Noise Effects ◽

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Dynamic timing analysis considering power supply noise effects

Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525) ◽

10.1109/isqed.2000.838866 ◽

2002 ◽

Author(s):

Y.-M. Jiang ◽

A. Krstic ◽

K.-T. Cheng

Keyword(s):

Power Supply ◽

Timing Analysis ◽

Power Supply Noise ◽

Noise Effects ◽

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Layout-aware pseudo-functional testing for critical paths considering power supply noise effects

2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) ◽

10.1109/date.2010.5457037 ◽

2010 ◽

Author(s):

Xiao Liu ◽

Yubin Zhang ◽

Feng Yuan ◽

Qiang Xu

Keyword(s):

Power Supply ◽

Functional Testing ◽

Power Supply Noise ◽

Noise Effects ◽

Supply Noise ◽

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Analysis of Performance Impact Caused by Power Supply Noise in Deep Submicron Devices

Signal Integrity Effects in Custom IC and ASIC Designs ◽

10.1109/9780470546413.ch31 ◽

2009 ◽

Keyword(s):

Power Supply ◽

Deep Submicron ◽

Power Supply Noise ◽

Performance Impact ◽

Supply Noise ◽

Submicron Devices ◽

Analysis Of Performance

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On-chip design techniques for reducing power supply noise effects on ADC with chip-PCB hierarchical structure

2012 IEEE International Symposium on Electromagnetic Compatibility ◽

10.1109/isemc.2012.6351672 ◽

2012 ◽

Author(s):

Bumhee Bae ◽

Jonghyun Cho ◽

Joungho Kim

Keyword(s):

Hierarchical Structure ◽

Power Supply ◽

Reducing Power ◽

Power Supply Noise ◽

Chip Design ◽

Noise Effects ◽

Supply Noise ◽

On Chip ◽

Design Techniques

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Power Supply Noise Analysis Methodology For Deep-submicron Vlsi Chip Design

Proceedings of the 34th Design Automation Conference ◽

10.1109/dac.1997.597223 ◽

2005 ◽

Author(s):

H.H. Chen ◽

D.D. Ling

Keyword(s):

Power Supply ◽

Noise Analysis ◽

Deep Submicron ◽

Power Supply Noise ◽

Chip Design ◽

Analysis Methodology ◽

Vlsi Chip ◽

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Vector generation for power supply noise estimation and verification of deep submicron designs

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/92.924055 ◽

2001 ◽

Vol 9 (2) ◽

pp. 329-340 ◽

Author(s):

Yi-Min Jiang ◽

Kwang-Ting Cheng

Keyword(s):

Power Supply ◽

Deep Submicron ◽

Noise Estimation ◽

Power Supply Noise ◽

Supply Noise ◽

Vector Generation

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