Development of a transmission line model for the thickness prediction of thin films via the infrared interference method
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1995 ◽
Vol 26
(1-3)
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pp. 59-63
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Characterization of contact resistance of low-value resistor by transmission line model (TLM) method
2002 ◽
Vol 85
(3)
◽
pp. 16-22
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2019 ◽
Vol 106
(5)
◽
pp. 785-798
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