A two-stage sixth-order sigma-delta ADC with 16-bit resolution designed for an oversampling ratio of 16

Author(s):  
A.J. Davis ◽  
G. Fischer
2016 ◽  
Vol 25 (05) ◽  
pp. 1650038
Author(s):  
Xinji Zeng ◽  
Jing Gao ◽  
Liu Yang ◽  
Jiangtao Xu

This paper presents the design and implementation of an extended-counting incremental sigma–delta ADC (IDC) with hardware-reuse technique. The proposed ADC architecture is a cascaded configuration of a second-order IDC and a two-stage cyclic ADC. The operation of the ADC consists of the “coarse phase” and the “fine phase”. In the “coarse phase”, the circuit works as an IDC to achieve the most significant bits (MSBs) and produce the residue voltage. Then in the “fine phase”, it is reused and changed to work as a cyclic ADC to quantize the residue voltage and achieve the least significant bits (LSBs). Eventual digital output is achieved by combining the two parts together. The utilization of extended-counting technique significantly reduces the conversion time and increases the conversion rate, and the hardware-reuse technique removes the demand for additional circuit area. The ADC is designed in 0.5[Formula: see text][Formula: see text]m CMOS process, which has a conversion rate of 43.48[Formula: see text]kS/s with oversampling ratio (OSR) of 23 and achieves 84.83[Formula: see text]dB SNDR and 13.799-bit ENOB. It consumes 2.4[Formula: see text]mW with a 5[Formula: see text]V voltage supply, and the FOM is 3.87[Formula: see text]pJ/step.


2005 ◽  
Vol 3 ◽  
pp. 277-280
Author(s):  
Y. Yin ◽  
H. Klar ◽  
P. Wennekers

Abstract. A 14-b, 5-MHz output-rate cascaded 3-1 sigma-delta analog-to-digital converters (ADC) has been developed for broadband communication applications, and a novel 4th-order noise-shaping is obtained by using the proposed architecture. At a low oversampling ratio (OSR) of 8, the ADC achieves 91.5dB signal-to-quantization ratio (SQNR), in contrast to 71.8dB of traditional 2-1-1 cascaded sigma-delta ADC in 2.5-MHz bandwidth and over 80dB signal-to-noise and distortion (SINAD) even under assumptions of awful circuit non-idealities and opamp non-linearity. The proposed architecture can potentially operates at much more high frequencies with scaled IC technology, to expand the analog-to-digital conversion rate for high-resolution applications.


2020 ◽  
Vol 63 (11) ◽  
pp. 586-595
Author(s):  
Alexander Korotkov ◽  
Dmitry Morozov ◽  
Mikhail Pilipko ◽  
Mikhail Yenuchenko

2007 ◽  
Vol 42 (11) ◽  
pp. 2357-2368 ◽  
Author(s):  
Teng-Hung Chang ◽  
Lan-Rong Dung ◽  
Jwin-Yen Guo ◽  
Kai-Jiun Yang
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