A simple data loss model for positron camera systems

Author(s):  
L. Eriksson
Keyword(s):  
1994 ◽  
Vol 41 (4) ◽  
pp. 1566-1570 ◽  
Author(s):  
L. Eriksson ◽  
K. Wienhard ◽  
M. Dahlbom
Keyword(s):  

Author(s):  
Yixing Huang ◽  
Guenter Lauritsch ◽  
Mario Amrehn ◽  
Oliver Taubmann ◽  
Viktor Haase ◽  
...  

Author(s):  
James F. Mancuso ◽  
William B. Maxwell ◽  
Russell E. Camp ◽  
Mark H. Ellisman

The imaging requirements for 1000 line CCD camera systems include resolution, sensitivity, and field of view. In electronic camera systems these characteristics are determined primarily by the performance of the electro-optic interface. This component converts the electron image into a light image which is ultimately received by a camera sensor.Light production in the interface occurs when high energy electrons strike a phosphor or scintillator. Resolution is limited by electron scattering and absorption. For a constant resolution, more energy deposition occurs in denser phosphors (Figure 1). In this respect, high density x-ray phosphors such as Gd2O2S are better than ZnS based cathode ray tube phosphors. Scintillating fiber optics can be used instead of a discrete phosphor layer. The resolution of scintillating fiber optics that are used in x-ray imaging exceed 20 1p/mm and can be made very large. An example of a digital TEM image using a scintillating fiber optic plate is shown in Figure 2.


2019 ◽  
Vol E102.B (8) ◽  
pp. 1676-1688 ◽  
Author(s):  
Mitsuki NAKAMURA ◽  
Motoharu SASAKI ◽  
Wataru YAMADA ◽  
Naoki KITA ◽  
Takeshi ONIZAWA ◽  
...  

Author(s):  
Rajesh Medikonduri

Abstract This paper discusses the physics, definitions, and nanoprobing flow of a flash bit memory. In addition, a case study showing the effectiveness of nanoprobing in detecting the Single Bit Fail Data Gain and Data Loss in Flash Memory is also discussed. The paper also includes cases where no passive voltage contrast was observed at the SEM and no leakage was observed at AFM, yet the units failing SBF DG, SBF DL and depletion, were detected by nanoprobing of the single bit. The major finding of this paper is a way to resolve data gain, data loss, and depletion failures of flash memory by nanoprobing procedure, despite no PVC seen at the SEM and no leakage seen at the AFM.


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