Very large area 20cm × 20cm flat panel phototubes using ALD microchannel plates

Author(s):  
O. H. W. Siegmund ◽  
C. D. Ertley ◽  
S. R. Jelinsky ◽  
J. B. McPhate ◽  
J. Tedesco ◽  
...  
Author(s):  
Camden Ertley ◽  
Alexey V. Lyashenko ◽  
Bernhard W. Adams ◽  
Till Cremer ◽  
Michael J. Minot ◽  
...  

2004 ◽  
Author(s):  
Katsumi Suzuki ◽  
Shigeyuki Ikeda ◽  
Ken Ueda ◽  
Tadashi Nakamura ◽  
Masakazu Okabe ◽  
...  

2014 ◽  
Vol 9 (11) ◽  
pp. P11011-P11011 ◽  
Author(s):  
X Wang ◽  
S U Setru ◽  
J Xie ◽  
A Mane ◽  
M Demarteau ◽  
...  

2003 ◽  
Author(s):  
Shigeyuki Ikeda ◽  
Katsumi Suzuki ◽  
Ken Ishikawa ◽  
Richard E. Colbeth ◽  
Chris Webb ◽  
...  

2002 ◽  
Vol 715 ◽  
Author(s):  
J.P. Lu ◽  
K. Van Schuylenbergh ◽  
J. Ho ◽  
Y. Wang ◽  
J. B. Boyce ◽  
...  

AbstractThe technology of large area electronics has made significant progress in recent years because of the fast maturing excimer laser annealing process. The new thin film transistors based on laser processed poly silicon provide unprecedented performance over the traditional thin film transistors using amorphous silicon. They open up the possibility of building flat panel displays and imagers with higher integration and performance. In this paper, we will review the progress of poly-Si thin film transistor technology with emphasis on imager applications. We also discuss the challenges of future improvement of flat panel imagers based on this technology.


2001 ◽  
Vol 11 (9) ◽  
pp. 1688-1696 ◽  
Author(s):  
Svenja P. Hennigs ◽  
Marietta Garmer ◽  
Horst J. Jaeger ◽  
Reinhard Classen ◽  
Andreas Jacobs ◽  
...  

2016 ◽  
Author(s):  
C. D. Ertley ◽  
O. H. W. Siegmund ◽  
S. R. Jelinsky ◽  
J. Tedesco ◽  
M. J. Minot ◽  
...  

1998 ◽  
Vol 509 ◽  
Author(s):  
F. G. Tarntair ◽  
C. C. Wang ◽  
W. K. Hong ◽  
H. K. Huang ◽  
H. C. Cheng

AbstractA triode structure of chimney-shaped field emitter arrays is proposed in this article. This triode structure includes the chimney-shaped emitter, thermal oxidation dioxide, and the plateau-shaped singlecrystalline silicon gate electrode. For the application of the matrix-addressable and large area flat panel display, the uniform structure of the emitters and the yield become critical manufacturing issues when attempting to control nano-meter size features. The uniformity and yield of the chimney-shaped emitters are very well controlled. The nano-sized gate-to-emitter separations can be created by the changing thickness of the insulator. The uniformity of the insulator and emitter material can be controlled within 3% which can be obtained by most large area thin film deposition tools, not by photolithography.


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