Numerical simulation on the dependence of carrier transport characteristics on the thickness of the absorbing layer for GaAs-based blocked impurity band (BIB) terahertz detectors

Author(s):  
Xiaodong Wang ◽  
Yulu Chen ◽  
Bingbing Wang ◽  
Chuansheng Zhang ◽  
Xiaoyao Chen ◽  
...  
1997 ◽  
Vol 484 ◽  
Author(s):  
C. S. Olsen ◽  
J. W. Beeman ◽  
W. L. Hansen ◽  
E. E. Hallerab

AbstractWe report on the development of Germanium Blocked Impurity Band (BIB) photoconductors for long wavelength infrared detection in the 100 to 250.μm region. Liquid Phase Epitaxy (LPE) was used to grow the high purity blocking layer, and in some cases, the heavily doped infrared absorbing layer that comprise theses detectors. To achieve the stringent demands on purity and crystalline perfection we have developed a high purity LPE process which can be used for the growth of high purity as well as purely doped Ge epilayers. The low melting point, high purity metal, Pb, was used as a solvent. Pb has a negligible solubility <1017 cm−3 in Ge at 650°C and is isoelectronic with Ge. We have identified the residual impurities Bi, P, and Sb in the Ge epilayers and have determined that the Pb solvent is the source. Experiments are in progress to purify the Pb. The first tests of BIB structures with the purely doped absorbing layer grown on high purity substrates look very promising. The detectors exhibit extended wavelength cutoff when compared to standard Ge:Ga photoconductors (155 μm vs. 120 μm) and show the expected asymmetric current-voltage dependencies. We are currently optimizing doping and layer thickness to achieve the optimum responsivity, Noise Equivalent Power (NEP), and dark current in our devices.


2011 ◽  
Vol 343-344 ◽  
pp. 181-187
Author(s):  
Ming Yue Fang ◽  
Jing Quan Zhang ◽  
Liang Huan Feng ◽  
Li Li Wu ◽  
Wei Li ◽  
...  

The CdTe thin film solar cells with the structure of ITO/ZnO/CdS/CdTe/Au were irradiated by 1.6MeV high-energy electrons with the fluences from 5×1013/cm2 to 1×1016/cm2. The characteristics of devices before and after irradiation were studied using dark current-voltage (I-V), capacitance-voltage (C-V) and admittance spectroscopy (AS) measurements in the temperature range from 303K to 353K. The results are shown that the diode ideal factor and dark saturation current for irradiated devices first decrease and then increase significantly with fluences from 5×1013/cm2 to 1×1016/cm2, meantime the effective carrier concentration at room temperature of CdTe absorbing layer increases first and then decreases. The carrier transport mechanisms in CdTe solar cells are analyzed before and after irradiation. The non-irradiated devices and irradiated devices with fluences less than 5×1014/cm2 are dominated by the recombination current of electron-hole pairs in the depletion layer. However, it is dominated by the recombination current of tunneling at the interface after the irradiation of higher fluences. The changes of types and amount of defects caused by electron irradiation are the major reasons for the above mentioned variations.


Author(s):  
А.Г. Тандоев ◽  
Т.Т. Мнацаканов ◽  
С.Н. Юрков

Abstract The effect of a set of quasi-neutral regimes of carrier transport in semiconductors, including, along with diffusion and drift, recently discovered diffusion stimulated by quasi-neutral drift, on the characteristics of structures is successively taken into account. The order of change in the carrier transport regimes in Schottky-diode structures is investigated and the features in the I – V characteristics caused by this change are established. The results of analytical study of these features are confirmed using numerical simulation.


2007 ◽  
Vol 989 ◽  
Author(s):  
Manuela Vieira ◽  
Yuri Vygranenko ◽  
Miguel Fernandes ◽  
Paula Louro ◽  
Pedro Sanguino ◽  
...  

AbstractThis paper investigates a feasibility of using a large area image sensor with an optically addressed readout for medical X-ray diagnostic imaging. A device prototype comprises a multilayer glass/ZnO:Al/p (a-SiC:H)/i (a-Si:H)/ n (a-SiC:H)/ i(a-Si:H)/p (a-SiC:H)/ a SiNx/ITO structure coupled to a scintillator layer. Here, the p-i-n-i-p structure works in both sensing and switching modes depending on the biasing conditions. A numerical simulation is used to optimize the semiconductor layer thicknesses in order to achieve a photocurrent matching between back-to-back diodes in switching mode. The charge carrier transport within the p-i-n-i-p structure is also analyzed under different electric and optical biasing conditions. A physical model supports the results.


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