A Compact High Current Generator for X-Ray Radiography

2005 ◽  
Author(s):  
B.M. Kovalchuk ◽  
A.V. Kharlov ◽  
V.B. Zorin
Keyword(s):  
High Current ◽  
Current Generator ◽  
X Ray

Compact high current generator for x-ray radiography

2006 ◽  
Vol 77 (12) ◽  
pp. 123501 ◽  
Author(s):  
A. V. Kharlov ◽  
B. M. Kovalchuk ◽  
V. B. Zorin
Keyword(s):  
High Current ◽  
Current Generator ◽  
X Ray

Spatial resolution of X-ray microanalysis in thin foils

1978 ◽  
Vol 36 (1) ◽  
pp. 544-545
Author(s):  
R. Hutchings ◽  
I.P. Jones ◽  
M.H. Loretto ◽  
R.E. Smallman
Keyword(s):  
Spatial Resolution ◽  
Electron Probe ◽  
Beam Divergence ◽  
Inelastic Interaction ◽  
Specimen Thickness ◽  
High Current ◽  
Beam Spreading ◽  
X Ray ◽  
Thin Foils ◽  
Complex Calculation

There is increasing interest in X-ray microanalysis of thin specimens and the present paper attempts to define some of the factors which govern the spatial resolution of this type of microanalysis. One of these factors is the spreading of the electron probe as it is transmitted through the specimen. There will always be some beam-spreading with small electron probes, because of the inevitable beam divergence associated with small, high current probes; a lower limit to the spatial resolution is thus 2αst where 2αs is the beam divergence and t the specimen thickness.In addition there will of course be beam spreading caused by elastic and inelastic interaction between the electron beam and the specimen. The angle through which electrons are scattered by the various scattering processes can vary from zero to 180° and it is clearly a very complex calculation to determine the effective size of the beam as it propagates through the specimen.

Influence of High Current Pulsed Electron Beam Irradiation on Ni-P Electroless Plating

2011 ◽  
Vol 299-300 ◽  
pp. 77-81
Author(s):  
Yang Xu ◽  
Sheng Zhi Hao ◽  
Xiang Dong Zhang ◽  
Min Cai Li ◽  
Chuang Dong
Keyword(s):  
Electroless Plating ◽  
Electron Beam Irradiation ◽  
Xrd Analysis ◽  
High Current ◽  
X Ray Diffraction ◽  
X Ray ◽  
Pulsed Electron Beam ◽  
6063 Aluminum Alloy ◽  
Pre Treatment ◽  
Better Than

The surface irradiation of 6063 aluminum alloy by high current pulsed electron was conducted with the aim of replacing the complicated pre-treatment in the processes of electroless plating. To explore the microstructure changes, optical metallography, SEM (scanning electron microscope), XRD (X-ray diffraction) analyses were carried out, and the sliding tests were used for the detection of wear resistance. It was concluded that the HCPEB irradiation could replace the pre-treatment of aluminum substrate as required in conventional electroless plating with a decreased surface roughness of Ni-P alloy plating layer. The plates exhibited an amorphous microstructure as demonstrated by XRD analysis. The plates, produced with the routine of HCPEB irradiation, activation and electroless plating possess, also exhibited good quality, even better than that of conventional electroless plating technique.

scholarly journals X-ray and Ion Emission Sources in High-current Discharge Plasma

2015 ◽  
Vol 71 ◽  
pp. 146-149 ◽  
Author(s):  
A.V. Balovnev ◽  
E.D. Vovchenko ◽  
I.G. Grigoryeva ◽  
E.I. Dodulad ◽  
A.S. Savelov ◽  
...  
Keyword(s):  
Discharge Plasma ◽  
Emission Sources ◽  
High Current ◽  
Current Discharge ◽  
X Ray ◽  
High Current Discharge ◽  
Ion Emission

Influence of Electron Beam Pulsed Times on the Properties of 40Cr

2010 ◽  
Vol 154-155 ◽  
pp. 1170-1177
Author(s):  
Yuan Fang Chen ◽  
Xiao Dong Peng ◽  
Jian Jun Hu ◽  
Hong Bin Xu ◽  
Chan Hao
Keyword(s):  
Surface Roughness ◽  
Wear Resistance ◽  
Corrosion Resistance ◽  
Electron Beam ◽  
High Current ◽  
Wear Properties ◽  
X Ray ◽  
Pulsed Electron Beam ◽  
Surface Microstructures ◽  
40Cr Steel

Surface modification of 40Cr steel by high current pulsed electron beam has been investigated . The pulsed times of HCPEB was changed from 1 to 25 to prepare different specimens. Surface microstructures and section microstructures after HCPEB irradiation were detected by using metallurgical microscope, SEM and X-ray diffractometer. It is shown that crater defects were found on the surface after the irradiation of HCPEB and the density of craters will decrease with increasing pulses times. When treated by 27Kev accelerating voltage, with increasing pulse times, the particles located in surface layer were obviously refined .The surface roughness, hardness, wear properties and corrosion resistance were analyzed after irradiation of HCPEB. The wear resistance and corrosion resistance were obviously enhanced after 10 pulses treatment.

scholarly journals Использование многоканальных лазерных комплексов для создания некогерентной накачки в комптоновских лазерах на свободных электронах рентгеновского диапазона

2018 ◽  
Vol 44 (14) ◽  
pp. 3
Author(s):  
Н.С. Гинзбург ◽  
Е.Р. Кочаровская ◽  
М.Н. Вилков ◽  
А.С. Сергеев
Keyword(s):  
Electron Beam ◽  
Energy Spectrum ◽  
Relativistic Electron Beam ◽  
High Efficiency ◽  
Relative Width ◽  
Free Electron Lasers ◽  
High Current ◽  
Scattering Process ◽  
X Ray ◽  
Multichannel Laser

AbstractIt is used that there is great potential in the use of multichannel laser complexes for incoherent pumping of X-ray Compton free-electron lasers based on stimulated wave backscattering on high-current moderately relativistic electron beam. The relative width of the pump spectrum must be comparable with that of the energy spectrum of the electron beam, which ensures involvement of a significant fraction of particles into the scattering process and, hence, high efficiency of their kinetic energy conversion into X-ray radiation.

Development of a high-current microbeam system

2014 ◽  
Vol 24 (03n04) ◽  
pp. 101-110 ◽  
Author(s):  
S. Matsuyama ◽  
K. Ishii ◽  
S. Suzuki ◽  
A. Terakawa ◽  
M. Fujiwara ◽  
...  
Keyword(s):  
Quadrupole Doublet ◽  
Spot Size ◽  
Beam Current ◽  
Chemical State ◽  
High Current ◽  
Rigid Support ◽  
Beam Spot ◽  
X Ray ◽  
Beam Spot Size

We report on the development of a high-current microbeam system for wavelength-dispersive X-ray micro particle-induced X-ray emission (WDX-[Formula: see text]-PIXE) for chemical state mapping. The microbeam system is composed of two slits and a quadrupole doublet lens mounted on a heavy rigid support. The microbeam system is installed immediately after a switching magnet. A beam brightness of [Formula: see text] is obtained at a half-divergence of 0.1 mrad. A beam current of more than 300 pA is obtained for object sizes of [Formula: see text] with a half-divergence of 0.2 mrad, which corresponds to a beam spot size of [Formula: see text]. The calculated spot size of the beam was [Formula: see text] and the measured spot size was [Formula: see text]. The WDX-[Formula: see text]-PIXE system with the microbeam system is now operational.

Small-Size High-Current Generators for X-Ray Backlighting

2017 ◽  
Vol 60 (8) ◽  
pp. 1408-1412 ◽  
Author(s):  
S. A. Chaikovsky ◽  
A. P. Artyomov ◽  
N. V. Zharova ◽  
A. S. Zhigalin ◽  
I. V. Lavrinovich ◽  
...  
Keyword(s):  
High Current ◽  
X Ray
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