Spectroscopic ellipsometry characterization of thin film photovoltaic materials and devices

2013 ◽  
Author(s):  
Michelle N. Sestak ◽  
Li Yan ◽  
Celine Eypert
Keyword(s):  
Thin Film ◽  
Spectroscopic Ellipsometry ◽  
Photovoltaic Materials

Integrated electrical and optical characterization of large area thin film photovoltaic materials

2012 ◽  
Author(s):  
Geza Szitasi ◽  
Ferenc Korsos ◽  
Daniel Selmeczi ◽  
Oliver Takacs ◽  
Ferenc Novinics ◽  
...  
Keyword(s):  
Thin Film ◽  
Optical Characterization ◽  
Large Area ◽  
Photovoltaic Materials

Broad band spectroscopic ellipsometry for the characterization of photovoltaic materials

Solar Cells ◽  
1991 ◽  
Vol 30 (1-4) ◽  
pp. 473-485 ◽  
Author(s):  
F.A. Abou-Elfotouh ◽  
G.S. Horner ◽  
T.J. Coutts ◽  
M.W. Wanlass
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Broad Band ◽  
Photovoltaic Materials

Spectroscopic Ellipsometry Characterization of Hydrogenated Amorphous Silicon Thin Film

2013 ◽  
Vol 33 (10) ◽  
pp. 1031001
Author(s):  
何剑 He Jian ◽  
李伟 Li Wei ◽  
徐睿 Xu Rui ◽  
郭安然 Guo Anran ◽  
祁康成 Qi Kangcheng ◽  
...  
Keyword(s):  
Thin Film ◽  
Amorphous Silicon ◽  
Spectroscopic Ellipsometry ◽  
Hydrogenated Amorphous Silicon ◽  
Silicon Thin Film ◽  
Hydrogenated Amorphous
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