Dynamic single event upset characterization of the Virtex-II and Spartan-3 SRAM field programmable gate arrays using proton irradiation
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2014 ◽
Vol 12
(10)
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2006 ◽
Vol 53
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pp. 3569-3574
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2011 ◽
Vol 58
(3)
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pp. 1040-1046
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