Compact Models for Radiation Hardening by Design of SiGe BiCMOS, GaAs and SOI CMOS Microwave Circuits

Author(s):  
Denis I. Sotskov ◽  
Nikolay A. Usachev ◽  
Vadim V. Elesin ◽  
Igor O. Metelkin ◽  
Nikita M. Zhidkov ◽  
...  

Author(s):  
Aibin Yan ◽  
Zhile Chen ◽  
Zhengfeng Huang ◽  
Xiangsheng Fang ◽  
Maoxiang Yi ◽  
...  


2009 ◽  
Vol 44 (5) ◽  
pp. 1617-1628 ◽  
Author(s):  
David J. Barnhart ◽  
Tanya Vladimirova ◽  
Martin N. Sweeting ◽  
Kenneth S. Stevens


2014 ◽  
Vol 61 (3) ◽  
pp. 1236-1242 ◽  
Author(s):  
Philippe C. Adell ◽  
Jeremy Yager ◽  
Zack Pannell ◽  
Jacob Shelton ◽  
Mohammad M. Mojarradi ◽  
...  


2014 ◽  
Vol 27 (2) ◽  
pp. 251-258 ◽  
Author(s):  
Alessandra Camplani ◽  
Seyedruhollah Shojaii ◽  
Hitesh Shrimali ◽  
Alberto Stabile ◽  
Valentino Liberali

Design techniques for radiation hardening of integrated circuits in commercial CMOS technologies are presented. Circuits designed with the proposed approaches are more tolerant to both total dose and to single event effects. The main drawback of the techniques for radiation hardening by design is the increase of silicon area, compared with a conventional design.



2019 ◽  
Vol 2 (1) ◽  
pp. 33-51
Author(s):  
Yu. M. Gerasimov ◽  
◽  
N. G. Grigoryev ◽  
A. V. Kobylyatskiy ◽  
Ya. Ya. Petrichkovich ◽  
...  


Author(s):  
Hesham Hassan Shaker ◽  
A. A. Saleh ◽  
Mohamed Refky Amin ◽  
S. E. D. Habib


Author(s):  
Yuriy M. Gerasimov ◽  
Nikolay G. Grigoryev ◽  
Andrey V. Kobylyatskiy ◽  
Yaroslav Ya. Petrichkovich ◽  
Tatiana V. Solokhina


Author(s):  
Denis I. Sotskov ◽  
Alexander G. Kuznetsov ◽  
Vadim V. Elesin ◽  
Nikolay A. Usachev ◽  
George V. Chukov ◽  
...  


Author(s):  
P. Chevalier ◽  
F. Gianesello ◽  
A. Pallotta ◽  
J. Azevedo Goncalves ◽  
G. Bertrand ◽  
...  
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