Investigation of charge loss mechanisms in planar and raised STI charge trapping flash memories

2010 ◽  
Author(s):  
Zhiliang Xia ◽  
Dae Sin Kim ◽  
Ju-Yul Lee ◽  
Keun-Ho Lee ◽  
Young-Kwan Park ◽  
...  
Keyword(s):  
Charge Trapping ◽  
Flash Memories ◽  
Charge Loss ◽  
Loss Mechanisms

Radiation Induced Charge Loss Mechanisms Across the Dielectrics of Floating Gate Flash Memories

2019 ◽  
Vol 6 (3) ◽  
pp. 807-843
Author(s):  
Giorgio Cellere ◽  
Andrea Cester ◽  
Alessandro Paccagnella
Keyword(s):  
Floating Gate ◽  
Flash Memories ◽  
Charge Loss ◽  
Radiation Induced ◽  
Induced Charge ◽  
Loss Mechanisms

Modeling of Charge Loss Mechanisms during the Short Term Retention Operation in 3-D NAND Flash Memories

2019 ◽  
Author(s):  
Changbeom Woo ◽  
Myeongwon Lee ◽  
Shinkeun Kim ◽  
Jaeyeol Park ◽  
Gil-Bok Choi ◽  
...  
Keyword(s):  
Nand Flash ◽  
Short Term ◽  
Flash Memories ◽  
Term Retention ◽  
Charge Loss ◽  
Loss Mechanisms

scholarly journals Multiscale Modeling of Charge Trapping in Molecule Based Flash Memories

2019 ◽  
Author(s):  
Oves Badami ◽  
Toufik Sadi ◽  
Vihar Georgiev ◽  
Fikru Adamu-Lema ◽  
Vasanthan Thirunavukkarasu ◽  
...  
Keyword(s):  
Multiscale Modeling ◽  
Charge Trapping ◽  
Flash Memories

Analytical Percolation Model for Predicting Anomalous Charge Loss in Flash Memories

2004 ◽  
Vol 51 (9) ◽  
pp. 1392-1400 ◽  
Author(s):  
R. Degraeve ◽  
F. Schuler ◽  
B. Kaczer ◽  
M. Lorenzini ◽  
D. Wellekens ◽  
...  
Keyword(s):  
Percolation Model ◽  
Flash Memories ◽  
Charge Loss

Revisiting Charge Trapping/Detrapping in Flash Memories From a Discrete and Statistical Standpoint—Part I: \(V_{T}\) Instabilities

2014 ◽  
Vol 61 (8) ◽  
pp. 2802-2810 ◽  
Author(s):  
Giovanni M. Paolucci ◽  
Christian Monzio Compagnoni ◽  
Carmine Miccoli ◽  
Alessandro S. Spinelli ◽  
Andrea L. Lacaita ◽  
...  
Keyword(s):  
Charge Trapping ◽  
Flash Memories

Experimental Study of 3D Fin-Channel Charge Trapping Flash Memories with TiN Metal and Poly-Si Gates

2013 ◽  
Author(s):  
Y.X. Liu ◽  
T. Matsukawa ◽  
K. Endo ◽  
S. O'uchi ◽  
J. Tsukada ◽  
...  
Keyword(s):  
Experimental Study ◽  
Charge Trapping ◽  
Flash Memories ◽  
Tin Metal
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