2013 IEEE International Reliability Physics Symposium (IRPS)
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9781479901135, 9781479901128, 9781479901111
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Effects of positive and negative constant voltage stress on organic TFTs

2013 ◽  
Author(s):  
N. Wrachien ◽  
A. Cester ◽  
D. Bari ◽  
G. Meneghesso ◽  
J. Kovac ◽  
...  
Keyword(s):  
Constant Voltage ◽  
Negative Constant ◽  
Voltage Stress

HKMG process impact on N, P BTI: Role of thermal IL scaling, IL/HK integration and post HK nitridation

2013 ◽  
Author(s):  
K. Joshi ◽  
S. Hung ◽  
S. Mukhopadhyay ◽  
V. Chaudhary ◽  
N. Nanaware ◽  
...  

Reliability characterization and FEM modeling of power devices under repetitive power pulsing

2013 ◽  
Author(s):  
F. Pozzobon ◽  
D. Paci ◽  
G. Pizzo ◽  
A. Buri ◽  
S. Morin ◽  
...  
Keyword(s):  
Power Devices ◽  
Fem Modeling

Wafer-level MEMS package and its reliability issues

2013 ◽  
Author(s):  
S. Tanaka ◽  
M. Esashi
Keyword(s):  
Wafer Level

Physical origins of plasma damage and its process/gate area effects on high-k metal gate technology

2013 ◽  
Author(s):  
P. J. Liao ◽  
S. H. Liang ◽  
H. Y. Lin ◽  
J. H. Lee ◽  
Y. Lee ◽  
...  
Keyword(s):  
Metal Gate ◽  
Plasma Damage ◽  
Area Effects ◽  
High K
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