Film thickness measurement system using FPGA technology

Author(s):  
Adriana Bonilla Riano ◽  
Antonio Bannwart ◽  
Hugo Fernando Velasco ◽  
O.M.H. Rodriguez ◽  
Horst-Michael Prasser
2019 ◽  
Vol 66 ◽  
pp. 86-98 ◽  
Author(s):  
A. Bonilla-Riaño ◽  
H.F. Velasco-Peña ◽  
A.C. Bannwart ◽  
H.-M. Prasser ◽  
O.M.H. Rodriguez

1992 ◽  
Author(s):  
David Willenborg ◽  
Susan M. Kelso ◽  
Jon L. Opsal ◽  
Jeffrey T. Fanton ◽  
Allan Rosencwaig

1996 ◽  
Author(s):  
Masahiro Horie ◽  
Nariaki Fujiwara ◽  
Masahiko Kokubo ◽  
Hiroshi Kakiuchida

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