scholarly journals Automatic Film Thickness Measurement System for Inkjet-Based Color Filters Based on Three-Wavelength Single-Shot Interferometry

2012 ◽  
Vol 78 (1) ◽  
pp. 86-91
Author(s):  
Katsuichi KITAGAWA ◽  
Hiroki SUGIHARA ◽  
Tatsuhiko TSUBOI ◽  
Kazuyoshi SUZUKI ◽  
Masafumi OTSUKI
Keyword(s):  
Film Thickness ◽  
Measurement System ◽  
Thickness Measurement ◽  
Single Shot ◽  
Film Thickness Measurement ◽  
Color Filters ◽  
Thickness Measurement System

Water film thickness measurement system for oil-water pipe flow

2019 ◽  
Vol 66 ◽  
pp. 86-98 ◽  
Author(s):  
A. Bonilla-Riaño ◽  
H.F. Velasco-Peña ◽  
A.C. Bannwart ◽  
H.-M. Prasser ◽  
O.M.H. Rodriguez
Keyword(s):  
Film Thickness ◽  
Measurement System ◽  
Pipe Flow ◽  
Water Film ◽  
Thickness Measurement ◽  
Water Pipe ◽  
Water Film Thickness ◽  
Oil Water ◽  
Film Thickness Measurement ◽  
Thickness Measurement System

Novel microspot dielectric film thickness measurement system

1992 ◽  
Author(s):  
David Willenborg ◽  
Susan M. Kelso ◽  
Jon L. Opsal ◽  
Jeffrey T. Fanton ◽  
Allan Rosencwaig
Keyword(s):  
Film Thickness ◽  
Measurement System ◽  
Dielectric Film ◽  
Thickness Measurement ◽  
Film Thickness Measurement ◽  
Thickness Measurement System

Film thickness measurement system using FPGA technology

2015 ◽  
Author(s):  
Adriana Bonilla Riano ◽  
Antonio Bannwart ◽  
Hugo Fernando Velasco ◽  
O.M.H. Rodriguez ◽  
Horst-Michael Prasser
Keyword(s):  
Film Thickness ◽  
Measurement System ◽  
Thickness Measurement ◽  
Film Thickness Measurement ◽  
Thickness Measurement System

Spectroscopic multilayer film thickness measurement system

1996 ◽  
Author(s):  
Masahiro Horie ◽  
Nariaki Fujiwara ◽  
Masahiko Kokubo ◽  
Hiroshi Kakiuchida
Keyword(s):  
Film Thickness ◽  
Measurement System ◽  
Multilayer Film ◽  
Thickness Measurement ◽  
Film Thickness Measurement ◽  
Thickness Measurement System
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