The Role of Carbon and Dysprosium in Ni[Dy]Si:C Contacts for Schottky-Barrier Height Reduction and Application in N-Channel MOSFETs With Si:C Source/Drain Stressors
2009 ◽
Vol 56
(11)
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pp. 2770-2777
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1996 ◽
Vol 35
(Part 1, No. 2B)
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pp. 1428-1430
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2016 ◽
Keyword(s):
2007 ◽
Vol 28
(12)
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pp. 1102-1104
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Keyword(s):
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2006 ◽
Vol 50
(7-8)
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pp. 1337-1340
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Keyword(s):
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2015 ◽
Vol 38
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pp. 50-56
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