A Current-Transient Methodology for Trap Analysis for GaN High Electron Mobility Transistors

2011 ◽  
Vol 58 (1) ◽  
pp. 132-140 ◽  
Author(s):  
Jungwoo Joh ◽  
Jesús A. del Alamo
Keyword(s):  
Electron Mobility ◽  
High Electron Mobility Transistors ◽  
Current Transient ◽  
High Electron ◽  
High Electron Mobility ◽  
Electron Mobility Transistors ◽  
A Current

Low-Frequency Noise Investigation of AlGaN/GaN High-Electron-Mobility Transistors

2021 ◽  
pp. 108050
Author(s):  
Maria Glória Caño de Andrade ◽  
Luis Felipe de Oliveira Bergamim ◽  
Braz Baptista Júnior ◽  
Carlos Roberto Nogueira ◽  
Fábio Alex da Silva ◽  
...  
Keyword(s):  
Electron Mobility ◽  
Low Frequency ◽  
High Electron Mobility Transistors ◽  
Frequency Noise ◽  
High Electron ◽  
Low Frequency Noise ◽  
High Electron Mobility ◽  
Electron Mobility Transistors
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