Analysis on New Read Disturbance Induced by Hot Carrier Injections in 3-D Channel-Stacked NAND Flash Memory

IEEE Transactions on Electron Devices ◽

10.1109/ted.2019.2920127 ◽

2019 ◽

Vol 66 (8) ◽

pp. 3326-3330 ◽

Author(s):

Dae woong Kwon ◽

Do-Bin Kim ◽

Junil Lee ◽

Sihyun Kim ◽

Ryoongbin Lee ◽

...

Keyword(s):

Flash Memory ◽

Nand Flash Memory ◽

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Hot Carrier Injection Phenomenon due to Excessive Natural Local Self-Boosting Effect in 3D NAND Flash Memory

10.7567/ssdm.2019.ps-2-07 ◽

2019 ◽

Author(s):

Y. Jeong ◽

I. Ham ◽

S.J. Baik ◽

M. Kang

Keyword(s):

Flash Memory ◽

Carrier Injection ◽

Nand Flash Memory ◽

Hot Carrier ◽

Hot Carrier Injection

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Hot-Carrier Injection-Induced Disturb and Improvement Methods in 3D NAND Flash Memory

2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) ◽

10.1109/vlsi-tsa.2019.8804652 ◽

2019 ◽

Author(s):

Wei-Liang Lin ◽

Wen-Jer Tsai ◽

C.C. Cheng ◽

Chun-Chang Lu ◽

S.H. Ku ◽

...

Keyword(s):

Flash Memory ◽

Carrier Injection ◽

Nand Flash Memory ◽

Hot Carrier ◽

Hot Carrier Injection

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Investigation and Compact Modeling of Hot-Carrier Injection for Read Disturbance in 3-D NAND Flash Memory

IEEE Transactions on Electron Devices ◽

10.1109/ted.2020.2993772 ◽

2020 ◽

Vol 67 (7) ◽

pp. 2778-2784

Author(s):

Dokyun Son ◽

Jaeyeol Park ◽

Hyungcheol Shin

Keyword(s):

Flash Memory ◽

Compact Modeling ◽

Carrier Injection ◽

Nand Flash Memory ◽

Hot Carrier ◽

Hot Carrier Injection

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Analysis and Modeling of Program Disturbance by Hot Carrier Injection in 3D NAND Flash Memory Using TCAD

JSTS Journal of Semiconductor Technology and Science ◽

10.5573/jsts.2019.19.6.571 ◽

2019 ◽

Vol 19 (6) ◽

pp. 571-576

Author(s):

Yongmin Lee ◽

Sungbak Kim ◽

Hyungcheol Shin

Keyword(s):

Flash Memory ◽

Carrier Injection ◽

Nand Flash Memory ◽

Hot Carrier ◽

Hot Carrier Injection

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Optimal dummy word line condition to suppress hot carrier injection phenomenon due to the natural local self-boosting effect in 3D NAND flash memory

Japanese Journal of Applied Physics ◽

10.35848/1347-4065/ab6b77 ◽

2020 ◽

Vol 59 (SG) ◽

pp. SGGB17 ◽

Author(s):

Youngseok Jeong ◽

Ilsik Ham ◽

Sangwoo Han ◽

Myounggon Kang

Keyword(s):

Flash Memory ◽

Carrier Injection ◽

Nand Flash Memory ◽

Hot Carrier ◽

Hot Carrier Injection ◽

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A Simple compact model for hot carrier injection phenomenon in 32 nm NAND flash memory device

2010 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) ◽

10.1109/edssc.2010.5713695 ◽

2010 ◽

Author(s):

Myounggon Kang ◽

Wookghee Hahn ◽

Il Han Park ◽

Hocheol Lee ◽

Juyoung Park ◽

...

Keyword(s):

Flash Memory ◽

Memory Device ◽

Compact Model ◽

Carrier Injection ◽

Nand Flash Memory ◽

Hot Carrier ◽

Hot Carrier Injection

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A New Read-Disturb Failure Mechanism Caused by Boosting Hot-Carrier Injection Effect in MLC NAND Flash Memory

2009 IEEE International Memory Workshop ◽

10.1109/imw.2009.5090574 ◽

2009 ◽

Author(s):

Hsin-Heng Wang ◽

Pei-Shan Shieh ◽

Chiu-Tsung Huang ◽

Kenji Tokami ◽

Ricky Kuo ◽

...

Keyword(s):

Failure Mechanism ◽

Flash Memory ◽

Carrier Injection ◽

Nand Flash Memory ◽

Hot Carrier ◽

Hot Carrier Injection ◽

Injection Effect

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Compact Model of Read Disturbance by Hot Carrier Injection in 3D NAND Flash Memory

2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ◽

10.1109/edtm47692.2020.9117879 ◽

2020 ◽

Author(s):

Jaeyeol Park ◽

Dokyun Son ◽

Minsoo Kim ◽

Hyungjun Jo ◽

Hyungcheol Shin

Keyword(s):

Flash Memory ◽

Compact Model ◽

Carrier Injection ◽

Nand Flash Memory ◽

Hot Carrier ◽

Hot Carrier Injection

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Novel Three Dimensional (3D) NAND Flash Memory Array Having Tied Bit-line and Ground Select Transistor (TiGer)

IEICE Transactions on Electronics ◽

10.1587/transele.e95.c.837 ◽

2012 ◽

Vol E95.C (5) ◽

pp. 837-841 ◽

Author(s):

Se Hwan PARK ◽

Yoon KIM ◽

Wandong KIM ◽

Joo Yun SEO ◽

Hyungjin KIM ◽

...

Keyword(s):

Flash Memory ◽

Three Dimensional ◽

Nand Flash Memory ◽

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Analysis on Hybrid SSD Configuration with Emerging Non-Volatile Memories Including Quadruple-Level Cell (QLC) NAND Flash Memory and Various Types of Storage Class Memories (SCMs)

IEICE Transactions on Electronics ◽

10.1587/transele.2019cdp0006 ◽

2020 ◽

Vol E103.C (4) ◽

pp. 171-180

Author(s):

Yoshiki TAKAI ◽

Mamoru FUKUCHI ◽

Chihiro MATSUI ◽

Reika KINOSHITA ◽

Ken TAKEUCHI

Keyword(s):

Flash Memory ◽

Nand Flash Memory

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