ATPD: an automatic test pattern generator for path delay faults

Proceedings International Test Conference 1996. Test and Design Validity ◽

10.1109/test.1996.557051 ◽

2002 ◽

Author(s):

D. Karayiannis ◽

S. Tragoudas

Keyword(s):

Test Pattern ◽

Pattern Generator ◽

Delay Faults ◽

Path Delay Faults ◽

Automatic Test ◽

Automatic Test Pattern Generator

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A fast nonenumerative automatic test pattern generator for path delay faults

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.771185 ◽

1999 ◽

Vol 18 (7) ◽

pp. 1050-1057 ◽

Author(s):

S. Tragoudas ◽

D. Karayiannis

Keyword(s):

Test Pattern ◽

Pattern Generator ◽

Delay Faults ◽

Path Delay Faults ◽

Automatic Test ◽

Automatic Test Pattern Generator

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DYNAMITE: an efficient automatic test pattern generation system for path delay faults

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.88928 ◽

1991 ◽

Vol 10 (10) ◽

pp. 1323-1335 ◽

Author(s):

K. Fuchs ◽

F. Fink ◽

M.H. Schulz

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Delay Faults ◽

Path Delay Faults ◽

Generation System ◽

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An automatic test pattern generator for at-speed robust path delay testing

Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259) ◽

10.1109/ats.1998.741595 ◽

2002 ◽

Author(s):

Yuan-Chieh Hsu ◽

S.K. Gupta

Keyword(s):

Test Pattern ◽

Pattern Generator ◽

Delay Testing ◽

Automatic Test ◽

Automatic Test Pattern Generator

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Advanced automatic test pattern generation techniques for path delay faults

[1989] The Nineteenth International Symposium on Fault-Tolerant Computing. Digest of Papers ◽

10.1109/ftcs.1989.105541 ◽

2003 ◽

Author(s):

M.H. Schulz ◽

K. Fuchs ◽

F. Fink

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Delay Faults ◽

Path Delay Faults ◽

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Design of an optimal test pattern generator for built-in self testing of path delay faults

Proceedings Eleventh International Conference on VLSI Design ◽

10.1109/icvd.1998.646603 ◽

2002 ◽

Author(s):

D.K. Das ◽

I. Chaudhuri ◽

B.B. Bhattacharya

Keyword(s):

Test Pattern ◽

Pattern Generator ◽

Delay Faults ◽

Path Delay Faults ◽

Optimal Test ◽

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Fast test pattern generation for all path delay faults considering various test classes

Proceedings ETC 93 Third European Test Conference ◽

10.1109/etc.1993.246529 ◽

2002 ◽

Author(s):

K. Fuchs ◽

H.C. Wittmann ◽

K.J. Antreich

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Delay Faults ◽

Path Delay Faults

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FUNTEST: a functional automatic test pattern generator for combinational circuits

10.1109/test.1989.82397 ◽

2003 ◽

Author(s):

S.A. Al-Arian ◽

M. Nordenso

Keyword(s):

Test Pattern ◽

Pattern Generator ◽

Combinational Circuits ◽

Automatic Test ◽

Automatic Test Pattern Generator

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Bit parallel test pattern generation for path delay faults

Proceedings the European Design and Test Conference. ED&TC 1995 ◽

10.1109/edtc.1995.470351 ◽

2002 ◽

Author(s):

M. Henftling ◽

H. Wittman

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Delay Faults ◽

Path Delay Faults ◽

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An efficient automatic test generation system for path delay faults in combinational circuits

Proceedings of the 8th International Conference on VLSI Design ◽

10.1109/icvd.1995.512097 ◽

2002 ◽

Author(s):

A.K. Majhi ◽

J. Jacob ◽

L.M. Patnaik ◽

V.D. Agrawal

Keyword(s):

Test Generation ◽

Delay Faults ◽

Combinational Circuits ◽

Path Delay Faults ◽

Generation System ◽

Automatic Test Generation ◽

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Training Neural Network for Machine Intelligence in Automatic Test Pattern Generator

2021 34th International Conference on VLSI Design and 2021 20th International Conference on Embedded Systems (VLSID) ◽

10.1109/vlsid51830.2021.00059 ◽

2021 ◽

Author(s):

Soham Roy ◽

Spencer K. Millican ◽

Vishwani D. Agrawal

Keyword(s):

Neural Network ◽

Test Pattern ◽

Pattern Generator ◽

Machine Intelligence ◽

Automatic Test ◽

Automatic Test Pattern Generator ◽

Training Neural Network

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