Reducing test-data volume using random-testable and periodic-testable scan chains in circuits with multiple scan chains

2004 ◽  
Author(s):  
I. Pomeranz
Keyword(s):  
Test Data ◽  
Multiple Scan ◽  
Data Volume ◽  
Scan Chains

Multilevel-Huffman Test-Data Compression for IP Cores With Multiple Scan Chains

2008 ◽  
Vol 16 (7) ◽  
pp. 926-931 ◽  
Author(s):  
Xrysovalantis Kavousianos ◽  
Emmanouil Kalligeros ◽  
Dimitris Nikolos
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Test Data Compression ◽  
Multiple Scan ◽  
Scan Chains ◽  
Ip Cores

On a Method of Getting Test Data for Boundary Scan Interconnection Test in Multiple Scan Chains

2014 ◽  
Vol 986-987 ◽  
pp. 1531-1535
Author(s):  
Xian Hua Yin ◽  
Cui Feng Xu
Keyword(s):  
Test Data ◽  
Test Time ◽  
Sorting Algorithm ◽  
Boundary Scan ◽  
Circuit Boards ◽  
Project Description ◽  
Description File ◽  
Multiple Scan ◽  
Scan Chains ◽  
Scan Chain

The goal of this paper is to present a new innovative method of getting test data for boundary scan interconnection test in multiple scan chains, so to decrease the test time and increase the efficiency and reliability. Firstly, a new model of configuring and optimizing multiple scan chains is formed based on the researches on greedy strategy for configuring multiple scan chains for internal test and the sorting algorithm of single scan chain for Cluster test. Then, a method of establishing test project description file (TPDF) is presented in order to get the test data quickly and effectively. During the testing of two different boundary-scan circuit boards, all faults can be detected. Experiment results show that the expected objective is achieved.

On test data volume reduction for multiple scan chain designs

2003 ◽  
Vol 8 (4) ◽  
pp. 460-469 ◽  
Author(s):  
Sudhakar M. Reddy ◽  
Kohei Miyase ◽  
Seiji Kajihara ◽  
Irith Pomeranz
Keyword(s):  
Test Data ◽  
Volume Reduction ◽  
Multiple Scan ◽  
Data Volume ◽  
Scan Chain
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