On reducing test data volume and test application time for multiple scan chain designs

2004 ◽  
Author(s):  
Huaxing Tang ◽  
S.M. Reddy ◽  
I. Pomeranz
Keyword(s):  
Test Data ◽  
Application Time ◽  
Test Application Time ◽  
Test Application ◽  
Multiple Scan ◽  
Data Volume ◽  
Scan Chain

scholarly journals Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time

2009 ◽  
Vol E92-D (7) ◽  
pp. 1462-1465 ◽  
Author(s):  
Yongjoon KIM ◽  
Myung-Hoon YANG ◽  
Jaeseok PARK ◽  
Eunsei PARK ◽  
Sungho KANG
Keyword(s):  
Test Data ◽  
Application Time ◽  
Test Application Time ◽  
Test Application ◽  
Data Volume
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