In-Circuit Characterization of Low-Frequency Stability Margins in Power Amplifiers

2019 ◽  
Vol 67 (2) ◽  
pp. 822-833
Author(s):  
Jose Manuel Gonzalez ◽  
Nerea Otegi ◽  
Aitziber Anakabe ◽  
Libe Mori ◽  
Asier Barcenilla ◽  
...  
Keyword(s):  
Power Amplifiers ◽  
Low Frequency ◽  
Frequency Stability ◽  
Stability Margins

scholarly journals Gaussian Pulse Characterization of RF Power Amplifiers

2021 ◽  
Vol 31 (4) ◽  
pp. 417-420
Author(s):  
Tommaso Cappello ◽  
Zoya Popovic ◽  
Kevin Morris ◽  
Angelo Cappello
Keyword(s):  
Power Amplifiers ◽  
Gaussian Pulse ◽  
Rf Power Amplifiers ◽  
Rf Power ◽  
Pulse Characterization

Using low-frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure prediction

2004 ◽  
Author(s):  
Jean-Guy Tartarin ◽  
Geoffroy Soubercaze-Pun ◽  
Abdelali Rennane ◽  
Laurent Bary ◽  
Robert Plana ◽  
...  
Keyword(s):  
Technology Assessment ◽  
Low Frequency ◽  
Failure Prediction ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Gan Hemt ◽  
Noise Characterization
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