A New Approach for Single-Event Effects Testing With Heavy Ion and Pulsed-Laser Irradiation: CMOS/SOI SRAM Substrate Removal
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2017 ◽
Vol 64
(1)
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pp. 106-112
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2003 ◽
Vol 209
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pp. 345-350
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2014 ◽
Vol 61
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pp. 1628-1634
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1983 ◽
Vol 44
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pp. C5-449-C5-454
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Keyword(s):
1983 ◽
Vol 44
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pp. C5-23-C5-36
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