A New Approach for Single-Event Effects Testing With Heavy Ion and Pulsed-Laser Irradiation: CMOS/SOI SRAM Substrate Removal

Author(s):  
Nderitu Kanyogoro ◽  
Stephen Buchner ◽  
Dale McMorrow ◽  
Harold Hughes ◽  
Michael S. Liu ◽  
...  
2019 ◽  
Vol 30 (5) ◽  
Author(s):  
Chang Cai ◽  
Tian-Qi Liu ◽  
Xiao-Yuan Li ◽  
Jie Liu ◽  
Zhan-Gang Zhang ◽  
...  

1993 ◽  
Vol 3 (12) ◽  
pp. 2173-2188
Author(s):  
N. G. Chechenin ◽  
A. V. Chernysh ◽  
V. V. Korneev ◽  
E. V. Monakhov ◽  
B. V. Seleznev

1983 ◽  
Vol 44 (C5) ◽  
pp. C5-449-C5-454 ◽  
Author(s):  
P. Baeri ◽  
M. G. Grimaldi ◽  
E. Rimini ◽  
G. Celotti

1983 ◽  
Vol 44 (C5) ◽  
pp. C5-23-C5-36 ◽  
Author(s):  
H. Kurz ◽  
L. A. Lompré ◽  
J. M. Liu

Author(s):  
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Hiroyuki Daido ◽  
Yukihiro Matsunaga ◽  
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Akihiro Nishimura ◽  
...  

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