Comparison of Single Event Transients Generated at Four Pulsed-Laser Test Facilities-NRL, IMS, EADS, JPL

2012 ◽  
Vol 59 (4) ◽  
pp. 988-998 ◽  
Author(s):  
S. Buchner ◽  
N. Roche ◽  
J. Warner ◽  
D. McMorrow ◽  
F. Miller ◽  
...  
Keyword(s):  
Pulsed Laser ◽  
Single Event ◽  
Single Event Transients

Comparison of single-event transients induced in an operational amplifier (LM124) by pulsed laser light and a broad beam of heavy ions

2004 ◽  
Vol 51 (5) ◽  
pp. 2776-2781 ◽  
Author(s):  
S. Buchner ◽  
D. McMorrow ◽  
C. Poivey ◽  
J. Howard ◽  
Y. Boulghassoul ◽  
...  
Keyword(s):  
Operational Amplifier ◽  
Heavy Ions ◽  
Laser Light ◽  
Pulsed Laser ◽  
Single Event ◽  
Broad Beam ◽  
Single Event Transients

scholarly journals Pulsed-laser testing methodology for single event transients in linear devices

2004 ◽  
Vol 51 (6) ◽  
pp. 3716-3722 ◽  
Author(s):  
S. Buchner ◽  
J. Howard ◽  
C. Poivey ◽  
D. McMorrow ◽  
R. Pease
Keyword(s):  
Pulsed Laser ◽  
Single Event ◽  
Testing Methodology ◽  
Single Event Transients

Pulsed-Laser Induced Single-Event Transients in InGaAs FinFETs on Bulk Silicon Substrates

2019 ◽  
Vol 66 (1) ◽  
pp. 376-383 ◽  
Author(s):  
Huiqi Gong ◽  
Kai Ni ◽  
En Xia Zhang ◽  
Andrew L. Sternberg ◽  
John A. Kozub ◽  
...  
Keyword(s):  
Pulsed Laser ◽  
Silicon Substrates ◽  
Single Event ◽  
Bulk Silicon ◽  
Single Event Transients

INVESTIGATION OF SINGLE-EVENT TRANSIENTS IN FAST INTEGRATED CIRCUITS WITH A PULSED LASER

2004 ◽  
Vol 14 (02) ◽  
pp. 327-339 ◽  
Author(s):  
P. Fouillat ◽  
V. Pouget ◽  
D. Lewis ◽  
S. Buchner ◽  
D. McMorrow
Keyword(s):  
Integrated Circuits ◽  
Failure Mechanisms ◽  
Pulsed Laser ◽  
Single Event ◽  
Testing Method ◽  
Single Event Transients ◽  
Radiation Induced

This paper describes the use of a pulsed laser for studying radiation-induced single-event transients in integrated circuits. The basic failure mechanisms and the fundamentals of the laser testing method are presented. Sample results are presented to illustrate the benefits of using a pulsed laser for studying single-event transients.

The Effects of Elevated Temperature on Pulsed-Laser-Induced Single Event Transients in Analog Devices

2009 ◽  
Vol 56 (6) ◽  
pp. 3138-3144 ◽  
Author(s):  
Dakai Chen ◽  
Stephen P. Buchner ◽  
Anthony M. Phan ◽  
Hak S. Kim ◽  
Andrew L. Sternberg ◽  
...  
Keyword(s):  
Elevated Temperature ◽  
Pulsed Laser ◽  
Single Event ◽  
Single Event Transients
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