INVESTIGATION OF SINGLE-EVENT TRANSIENTS IN FAST INTEGRATED CIRCUITS WITH A PULSED LASER

Selected Topics in Electronics and Systems - Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices ◽

10.1142/9789812794703_0004 ◽

2004 ◽

pp. 43-55 ◽

Author(s):

P. Fouillat ◽

V. Pouget ◽

D. Lewis ◽

S. Buchner ◽

D. McMorrow

Keyword(s):

Integrated Circuits ◽

Pulsed Laser ◽

Single Event ◽

Single Event Transients

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INVESTIGATION OF SINGLE-EVENT TRANSIENTS IN FAST INTEGRATED CIRCUITS WITH A PULSED LASER

International Journal of High Speed Electronics and Systems ◽

10.1142/s0129156404002387 ◽

2004 ◽

Vol 14 (02) ◽

pp. 327-339 ◽

Author(s):

P. Fouillat ◽

V. Pouget ◽

D. Lewis ◽

S. Buchner ◽

D. McMorrow

Keyword(s):

Integrated Circuits ◽

Failure Mechanisms ◽

Pulsed Laser ◽

Single Event ◽

Testing Method ◽

Single Event Transients ◽

Radiation Induced

This paper describes the use of a pulsed laser for studying radiation-induced single-event transients in integrated circuits. The basic failure mechanisms and the fundamentals of the laser testing method are presented. Sample results are presented to illustrate the benefits of using a pulsed laser for studying single-event transients.

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Single event transients in PDSOI CMOS inverter chain irradiated by pulsed laser

2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) ◽

10.1109/icsict.2014.7021292 ◽

2014 ◽

Author(s):

Xing Zhao ◽

Bo Mei ◽

Jinshun Bi ◽

Zhongshan Zheng ◽

Linchun Gao ◽

...

Keyword(s):

Pulsed Laser ◽

Single Event ◽

Cmos Inverter ◽

Single Event Transients

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Single event transients generation in silicon devices with pulsed laser

2015 10th Spanish Conference on Electron Devices (CDE) ◽

10.1109/cde.2015.7087497 ◽

2015 ◽

Author(s):

Ivan de Paul ◽

Franco N. Bandi ◽

Jaume Segura ◽

Sebastia A. Bota

Keyword(s):

Pulsed Laser ◽

Single Event ◽

Silicon Devices ◽

Single Event Transients

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Comparison of Single Event Transients Generated at Four Pulsed-Laser Test Facilities-NRL, IMS, EADS, JPL

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2012.2201956 ◽

2012 ◽

Vol 59 (4) ◽

pp. 988-998 ◽

Author(s):

S. Buchner ◽

N. Roche ◽

J. Warner ◽

D. McMorrow ◽

F. Miller ◽

...

Keyword(s):

Pulsed Laser ◽

Single Event ◽

Single Event Transients

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Comparison of single-event transients induced in an operational amplifier (LM124) by pulsed laser light and a broad beam of heavy ions

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2004.835111 ◽

2004 ◽

Vol 51 (5) ◽

pp. 2776-2781 ◽

Author(s):

S. Buchner ◽

D. McMorrow ◽

C. Poivey ◽

J. Howard ◽

Y. Boulghassoul ◽

...

Keyword(s):

Operational Amplifier ◽

Laser Light ◽

Pulsed Laser ◽

Single Event ◽

Single Event Transients

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Comparison of Single-Event Transients in an Epitaxial Silicon Diode Resulting from Heavy Ion-, Focused X-Ray-, and Pulsed Laser-Induced Charge Generation

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2021.3060339 ◽

2021 ◽

pp. 1-1

Author(s):

Kaitlyn L. Ryder ◽

Landen D. Ryder ◽

Andrew L. Sternberg ◽

John A. Kozub ◽

En Xia Zhang ◽

...

Keyword(s):

Pulsed Laser ◽

Heavy Ion ◽

Single Event ◽

Epitaxial Silicon ◽

Charge Generation ◽

X Ray ◽

Silicon Diode ◽

Single Event Transients ◽

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Single Event Transients Detection in AD844 Operational Amplifier by Utilizing Ultra-fast Pulsed Laser System

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) ◽

10.1109/redw51883.2020.9325852 ◽

2020 ◽

Author(s):

Cheng Gu ◽

David Hiemstra ◽

Valeri Kirischian ◽

Li Chen

Keyword(s):

Operational Amplifier ◽

Laser System ◽

Pulsed Laser ◽

Single Event ◽

Single Event Transients

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SPICE Simulations of Single Event Transients in Bipolar Analog Integrated Circuits Using Public Information and Free Open Source Tools

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2015.2416000 ◽

2015 ◽

Vol 62 (4) ◽

pp. 1625-1633 ◽

Author(s):

Francisco J. Franco ◽

Carlos Palomar ◽

Jesus G. Izquierdo ◽

Juan A. Agapito

Keyword(s):

Integrated Circuits ◽

Open Source ◽

Public Information ◽

Analog Integrated Circuits ◽

Single Event ◽

Single Event Transients ◽

Free Open Source

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Pulsed-laser testing methodology for single event transients in linear devices

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2004.839263 ◽

2004 ◽

Vol 51 (6) ◽

pp. 3716-3722 ◽

Author(s):

S. Buchner ◽

J. Howard ◽

C. Poivey ◽

D. McMorrow ◽

R. Pease

Keyword(s):

Pulsed Laser ◽

Single Event ◽

Testing Methodology ◽

Single Event Transients

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Single-Event Transients in Bipolar Linear Integrated Circuits

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2006.882497 ◽

2006 ◽

Vol 53 (6) ◽

pp. 3079-3102 ◽

Author(s):

Stephen Buchner ◽

Dale McMorrow

Keyword(s):

Integrated Circuits ◽

Single Event ◽

Single Event Transients

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