INVESTIGATION OF SINGLE-EVENT TRANSIENTS IN FAST INTEGRATED CIRCUITS WITH A PULSED LASER

2004 ◽  
Vol 14 (02) ◽  
pp. 327-339 ◽  
Author(s):  
P. Fouillat ◽  
V. Pouget ◽  
D. Lewis ◽  
S. Buchner ◽  
D. McMorrow
Keyword(s):  
Integrated Circuits ◽  
Failure Mechanisms ◽  
Pulsed Laser ◽  
Single Event ◽  
Testing Method ◽  
Single Event Transients ◽  
Radiation Induced

This paper describes the use of a pulsed laser for studying radiation-induced single-event transients in integrated circuits. The basic failure mechanisms and the fundamentals of the laser testing method are presented. Sample results are presented to illustrate the benefits of using a pulsed laser for studying single-event transients.

On the analysis of radiation-induced Single Event Transients on SRAM-based FPGAs

2018 ◽  
Vol 88-90 ◽  
pp. 936-940 ◽  
Author(s):  
S. Azimi ◽  
L. Sterpone ◽  
B. Du ◽  
L. Boragno
Keyword(s):  
Single Event ◽  
Single Event Transients ◽  
Radiation Induced

Comparison of Single Event Transients Generated at Four Pulsed-Laser Test Facilities-NRL, IMS, EADS, JPL

2012 ◽  
Vol 59 (4) ◽  
pp. 988-998 ◽  
Author(s):  
S. Buchner ◽  
N. Roche ◽  
J. Warner ◽  
D. McMorrow ◽  
F. Miller ◽  
...  
Keyword(s):  
Pulsed Laser ◽  
Single Event ◽  
Single Event Transients

Comparison of single-event transients induced in an operational amplifier (LM124) by pulsed laser light and a broad beam of heavy ions

2004 ◽  
Vol 51 (5) ◽  
pp. 2776-2781 ◽  
Author(s):  
S. Buchner ◽  
D. McMorrow ◽  
C. Poivey ◽  
J. Howard ◽  
Y. Boulghassoul ◽  
...  
Keyword(s):  
Operational Amplifier ◽  
Heavy Ions ◽  
Laser Light ◽  
Pulsed Laser ◽  
Single Event ◽  
Broad Beam ◽  
Single Event Transients
Sign in / Sign up

Export Citation Format

Share Document